Inventor · disambiguated record
Hiroki Wakimoto
Also filed as: WAKIMOTO HIROKI
24 granted patents·2 pending applications·90 citations·filing 2001–2025
93Inventor score
Files withFUJI ELECTRIC CO LTD16FUJI ELEC DEVICE TECH CO LTD2FUJI ELECTRIC SYSTEMS CO LTD2WAKIMOTO HIROKI2KAZAMA KENICHI1
Top patents by PatentIndex Score
26 records- 0189US6737705B2Insulated gate semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2001·Granted May 18, 2004·58 cites·5 claims
- 0284US12205993B2Semiconductor device, and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Granted Jan 21, 2025·0 cites·18 claims
- 0378US9978843B2Silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted May 22, 2018·3 cites·13 claims
- 0478US2025159954A1Semiconductor device, and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 0575US11646350B2Semiconductor device, and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted May 9, 2023·0 cites·20 claims
- 0674US10312331B2Semiconductor device, and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Jun 4, 2019·1 cites·13 claims
- 0774US8399309B2Semiconductor device manufacturing methodOGINO MASAAKI·Filed 2011·Granted Mar 19, 2013·5 cites·24 claims
- 0874US8008734B2Power semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2008·Granted Aug 30, 2011·6 cites·19 claims
- 0973US9018633B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted Apr 28, 2015·3 cites·18 claims
- 1071US7737490B2Vertical and trench type insulated gate MOS semiconductor deviceFUJI ELECTRIC SYSTEMS CO LTD·Filed 2007·Granted Jun 15, 2010·4 cites·17 claims
- 1168US8324044B2Method of producing a semiconductor device with an aluminum or aluminum alloy electrodeKAZAMA KENICHI·Filed 2010·Granted Dec 4, 2012·2 cites·6 claims
- 1267US8604584B2Semiconductor device and method of manufacturing semiconductor deviceWAKIMOTO HIROKI·Filed 2011·Granted Dec 10, 2013·2 cites·6 claims
- 1366US10923570B2Manufacturing method for controlling carrier lifetimes in semiconductor substrates that includes injection and annealingFUJI ELECTRIC CO LTD·Filed 2019·Granted Feb 16, 2021·0 cites·8 claims
- 1465US7897452B2Method of producing a semiconductor device with an aluminum or aluminum alloy rear electrodeFUJI ELECTRIC SYSTEMS CO LTD·Filed 2006·Granted Mar 1, 2011·2 cites·15 claims
- 1554US9355858B2Method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2013·Granted May 31, 2016·0 cites·15 claims
- 1653US8722487B2Semiconductor device with an electrode including an aluminum-silicon filmFUJI ELECTRIC CO LTD·Filed 2012·Granted May 13, 2014·0 cites·6 claims
- 1750US7151297B2Insulated gate semiconductor deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2004·Granted Dec 19, 2006·4 cites·2 claims
- 1846US9385210B2Method for manufacturing semiconductor device using a gettering layerFUJI ELECTRIC CO LTD·Filed 2014·Granted Jul 5, 2016·0 cites·11 claims
- 1946US7462911B2Insulated gate semiconductor deviceFUJI ELEC DEVICE TECH CO LTD·Filed 2006·Granted Dec 9, 2008·0 cites·6 claims
- 2044US10388723B2Semiconductor device and semiconductor device manufacturing methodFUJI ELECTRIC CO LTD·Filed 2017·Granted Aug 20, 2019·0 cites·15 claims
- 2143US8242556B2Vertical and trench type insulated gate MOS semiconductor deviceYOSHIKAWA KOH·Filed 2010·Granted Aug 14, 2012·0 cites·2 claims
- 2242US2014361312A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2014·Application pending·0 cites
- 2341US9793343B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Oct 17, 2017·0 cites·9 claims
- 2437US9608073B2Semiconductor device and method of manufacturing semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted Mar 28, 2017·0 cites·8 claims
- 2536US8531007B2Semiconductor device and the method for manufacturing the sameOKUMURA KATSUYA·Filed 2010·Granted Sep 10, 2013·0 cites·17 claims
- 2635US9240456B2Method for manufacturing semiconductor deviceWAKIMOTO HIROKI·Filed 2011·Granted Jan 19, 2016·0 cites·21 claims
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