Inventor · disambiguated record
Keith A. Jenkins
Also filed as: JENKINS KEITH A · JENKINS KEITH AELWYN
73 granted patents·8 pending applications·585 citations·filing 1994–2019
99Inventor score
Top patents by PatentIndex Score
81 records- 0195US8816787B2High frequency oscillator circuit and method to operate sameJENKINS KEITH A·Filed 2012·Granted Aug 26, 2014·14 cites·18 claims
- 0295US8106383B2Self-aligned graphene transistorJENKINS KEITH A·Filed 2009·Granted Jan 31, 2012·50 cites·17 claims
- 0395US7863918B2Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuitsIBM·Filed 2007·Granted Jan 4, 2011·32 cites·22 claims
- 0494US7355429B2On-chip power supply noise detectorIBM·Filed 2005·Granted Apr 8, 2008·26 cites·13 claims
- 0591US7033927B2Apparatus and method for thermal isolation, circuit cooling and electromagnetic shielding of a waferIBM·Filed 2004·Granted Apr 25, 2006·76 cites·6 claims
- 0691US5656849ATwo-level spiral inductor structure having a high inductance to area ratioIBM·Filed 1996·Granted Aug 12, 1997·131 cites·5 claims
- 0790US9863994B2On-chip leakage measurementIBM·Filed 2016·Granted Jan 9, 2018·4 cites·20 claims
- 0889US10360526B2Analytics to determine customer satisfactionIBM·Filed 2016·Granted Jul 23, 2019·5 cites·20 claims
- 0989US7452128B2On chip temperature measuring and monitoring circuit and methodIBM·Filed 2007·Granted Nov 18, 2008·10 cites·6 claims
- 1087US10295589B2Electromigration wearout detection circuitsIBM·Filed 2016·Granted May 21, 2019·3 cites·20 claims
- 1187US10002810B2On-chip combined hot carrier injection and bias temperature instability monitorIBM·Filed 2015·Granted Jun 19, 2018·4 cites·20 claims
- 1287US7443187B2On-chip power supply noise detectorIBM·Filed 2007·Granted Oct 28, 2008·12 cites·9 claims
- 1386US9835584B2Remote sensing using pulse-width modulationIBM·Filed 2015·Granted Dec 5, 2017·2 cites·8 claims
- 1484US9660806B2Carbon nanotube array for cryptographic key generation and protectionIBM·Filed 2014·Granted May 23, 2017·6 cites·15 claims
- 1583US7255476B2On chip temperature measuring and monitoring circuit and methodIBM·Filed 2004·Granted Aug 14, 2007·20 cites·22 claims
- 1682US7688058B2Integrated spectrum analyzer circuits and methods for providing on-chip diagnosticsIBM·Filed 2008·Granted Mar 30, 2010·8 cites·19 claims
- 1781US9791499B2Circuit to detect previous use of computer chips using passive test wiresIBM·Filed 2015·Granted Oct 17, 2017·3 cites·11 claims
- 1881US7439755B2Electronic circuit for measurement of transistor variability and the likeIBM·Filed 2007·Granted Oct 21, 2008·8 cites·14 claims
- 1980US10782336B2BTI degradation test circuitIBM·Filed 2016·Granted Sep 22, 2020·2 cites·25 claims
- 2079US9702924B2Simultaneously measuring degradation in multiple FETsIBM·Filed 2015·Granted Jul 11, 2017·2 cites·18 claims
- 2178US10739391B2Duty cycle measurementIBM·Filed 2017·Granted Aug 11, 2020·1 cites·18 claims
- 2278US9866221B2Test circuit to isolate HCI degradationIBM·Filed 2016·Granted Jan 9, 2018·3 cites·22 claims
- 2376US10102090B2Non-destructive analysis to determine use history of processorIBM·Filed 2016·Granted Oct 16, 2018·2 cites·20 claims
- 2476US7116092B2Integrated spectrum analyzer circuits and methods for providing on-chip diagnosticsIBM·Filed 2004·Granted Oct 3, 2006·14 cites·31 claims
- 2575US10671958B2Analytics to determine customer satisfactionIBM·Filed 2019·Granted Jun 2, 2020·1 cites·18 claims
- 2674US5936299ASubstrate contact for integrated spiral inductorsIBM·Filed 1997·Granted Aug 10, 1999·33 cites·15 claims
- 2774US5485029AOn-chip ground plane for semiconductor devices to reduce parasitic signal propagationIBM·Filed 1994·Granted Jan 16, 1996·43 cites·24 claims
- 2873US10247769B2Measuring individual device degradation in CMOS circuitsIBM·Filed 2015·Granted Apr 2, 2019·1 cites·20 claims
- 2972US7791330B2On-chip jitter measurement circuitIBM·Filed 2008·Granted Sep 7, 2010·5 cites·24 claims
- 3071US9952274B2Measurement for transistor output characteristics with and without self heatingIBM·Filed 2015·Granted Apr 24, 2018·1 cites·10 claims
- 3170US10365702B2Autonomic supply voltage compensation for degradation of circuits over circuit lifetimeIBM·Filed 2017·Granted Jul 30, 2019·1 cites·19 claims
- 3270US7538652B2Electrical component tuned by conductive layer deletionIBM·Filed 2006·Granted May 26, 2009·4 cites·16 claims
- 3369US7780347B2On chip temperature measuring and monitoring circuit and methodIBM·Filed 2008·Granted Aug 24, 2010·2 cites·2 claims
- 3469US7645071B2On chip temperature measuring and monitoring methodIBM·Filed 2008·Granted Jan 12, 2010·2 cites·16 claims
- 3569US7439724B2On-chip jitter measurement circuitIBM·Filed 2003·Granted Oct 21, 2008·12 cites·1 claims
- 3667US9276524B2High frequency oscillator circuitJENKINS KEITH A·Filed 2012·Granted Mar 1, 2016·2 cites·12 claims
- 3767US7378831B1System and method for determining a delay time interval of componentsIBM·Filed 2007·Granted May 27, 2008·4 cites·5 claims
- 3866US8004305B2Electronic circuit for measurement of transistor variability and the likeIBM·Filed 2009·Granted Aug 23, 2011·3 cites·7 claims
- 3965US10901025B2Measuring individual device degradation in CMOS circuitsIBM·Filed 2018·Granted Jan 26, 2021·0 cites·20 claims
- 4065US10491610B2Remote monitoring of softwareIBM·Filed 2016·Granted Nov 26, 2019·1 cites·18 claims
- 4165US9817047B2Duty cycle measurementIBM·Filed 2015·Granted Nov 14, 2017·1 cites·7 claims
- 4264US6441602B1Method and apparatus for determining phase locked loop jitterIBM·Filed 2000·Granted Aug 27, 2002·13 cites·16 claims
- 4363US8829922B2On-chip measurement of AC variability in individual transistor devicesBALAKRISHNAN KARTHIK·Filed 2011·Granted Sep 9, 2014·1 cites·20 claims
- 4463US7762721B2On chip temperature measuring and monitoring methodIBM·Filed 2008·Granted Jul 27, 2010·1 cites·8 claims
- 4562US10564213B2Dielectric breakdown monitorIBM·Filed 2017·Granted Feb 18, 2020·1 cites·20 claims
- 4662US8362477B2High density memory deviceIBM·Filed 2010·Granted Jan 29, 2013·1 cites·17 claims
- 4760US7764080B2Methods of operating an electronic circuit for measurement of transistor variability and the likeIBM·Filed 2008·Granted Jul 27, 2010·2 cites·14 claims
- 4859US10433173B2Touch movement activation for gaining access beyond a restricted access gatewayIBM·Filed 2017·Granted Oct 1, 2019·0 cites·20 claims
- 4959US10388580B2On-chip combined hot carrier injection and bias temperature instability monitorIBM·Filed 2018·Granted Aug 20, 2019·0 cites·16 claims
- 5058US10552278B2Non-destructive analysis to determine use history of processorIBM·Filed 2018·Granted Feb 4, 2020·0 cites·20 claims
Showing the top 50 of 81 patent records by PatentIndex Score.
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