Inventor · disambiguated record
John Dunklee
Also filed as: DUNKLEE JOHN · DUNKLEE JOHN L
48 granted patents·855 citations·filing 1999–2020
99Inventor score
Top patents by PatentIndex Score
48 records- 0197US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 0296US7187188B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2004·Granted Mar 6, 2007·90 cites·19 claims
- 0396US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 0495US7518358B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·17 cites·12 claims
- 0594US7501810B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Mar 10, 2009·16 cites·10 claims
- 0694US7304488B2Shielded probe for high-frequency testing of a device under testCASCADE MICROTECH INC·Filed 2006·Granted Dec 4, 2007·19 cites·1 claims
- 0794US6642732B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2002·Granted Nov 4, 2003·52 cites·21 claims
- 0893US7514915B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 7, 2009·14 cites·5 claims
- 0993US7352168B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2005·Granted Apr 1, 2008·14 cites·16 claims
- 1093US6512391B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2002·Granted Jan 28, 2003·42 cites·8 claims
- 1192US7423419B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Sep 9, 2008·12 cites·5 claims
- 1292US7362115B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2007·Granted Apr 22, 2008·20 cites·19 claims
- 1392US7250779B2Probe station with low inductance pathCASCADE MICROTECH INC·Filed 2003·Granted Jul 31, 2007·42 cites·9 claims
- 1492US6861856B2Guarded tub enclosureCASCADE MICROTECH INC·Filed 2002·Granted Mar 1, 2005·62 cites·21 claims
- 1590US7482823B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jan 27, 2009·11 cites·33 claims
- 1690US7221172B2Switched suspended conductor and connectionCASCADE MICROTECH INC·Filed 2004·Granted May 22, 2007·36 cites·18 claims
- 1789US7292057B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2006·Granted Nov 6, 2007·9 cites·8 claims
- 1888US7436194B2Shielded probe with low contact resistance for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Oct 14, 2008·10 cites·20 claims
- 1988US6965226B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2001·Granted Nov 15, 2005·25 cites·17 claims
- 2087US7518387B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·9 cites·55 claims
- 2187US7221146B2Guarded tub enclosureCASCADE MICROTECH INC·Filed 2005·Granted May 22, 2007·16 cites·22 claims
- 2287US7138813B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2003·Granted Nov 21, 2006·24 cites·20 claims
- 2387US6445202B1Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 1999·Granted Sep 3, 2002·56 cites·20 claims
- 2486US7969173B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jun 28, 2011·6 cites·8 claims
- 2586US7489149B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Feb 10, 2009·8 cites·17 claims
- 2684US9726694B2Test systems with a probe apparatus and index mechanismCELADON SYSTEMS INC·Filed 2015·Granted Aug 8, 2017·2 cites·11 claims
- 2784US7616017B2Probe station thermal chuck with shielding for capacitive currentCASCADE MICROTECH INC·Filed 2007·Granted Nov 10, 2009·5 cites·19 claims
- 2884US7554322B2Probe stationCASCADE MICROTECH INC·Filed 2005·Granted Jun 30, 2009·8 cites·5 claims
- 2982US7468609B2Switched suspended conductor and connectionCASCADE MICROTECH INC·Filed 2007·Granted Dec 23, 2008·9 cites·18 claims
- 3080US8994390B2Test systems with a probe apparatus and index mechanismROOT BRYAN J·Filed 2012·Granted Mar 31, 2015·3 cites·13 claims
- 3180US7498828B2Probe station with low inductance pathCASCADE MICROTECH INC·Filed 2007·Granted Mar 3, 2009·8 cites·10 claims
- 3279US7618590B2Fluid dispensing systemCASCADE MICROTECH INC·Filed 2006·Granted Nov 17, 2009·13 cites·2 claims
- 3378US9018966B2Test apparatus having a probe card and connector mechanismROOT BRYAN J·Filed 2012·Granted Apr 28, 2015·3 cites·11 claims
- 3477US9024651B2Test apparatus having a probe card and connector mechanismROOT BRYAN J·Filed 2012·Granted May 5, 2015·3 cites·2 claims
- 3576US10261124B2Modular rail systems, rail systems, mechanisms, and equipment for devices under testCELADON SYSTEMS INC·Filed 2016·Granted Apr 16, 2019·1 cites·28 claims
- 3676US6914423B2Probe stationCASCADE MICROTECH INC·Filed 2001·Granted Jul 5, 2005·16 cites·23 claims
- 3775US7876115B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2009·Granted Jan 25, 2011·7 cites·4 claims
- 3871US11313902B2Modular rail systems, rail systems, mechanisms, and equipment for devices under testCELADON SYSTEMS INC·Filed 2020·Granted Apr 26, 2022·0 cites·19 claims
- 3968US10620262B2Modular rail systems, rail systems, mechanisms, and equipment for devices under testCELADON SYSTEMS INC·Filed 2019·Granted Apr 14, 2020·0 cites·18 claims
- 4068US7688062B2Probe stationCASCADE MICROTECH INC·Filed 2007·Granted Mar 30, 2010·2 cites·8 claims
- 4168US7492172B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2004·Granted Feb 17, 2009·12 cites·6 claims
- 4267US7639003B2Guarded tub enclosureCASCADE MICROTECH INC·Filed 2007·Granted Dec 29, 2009·4 cites·6 claims
- 4363US10145863B2Test systems with a probe apparatus and index mechanismCELADON SYSTEMS INC·Filed 2017·Granted Dec 4, 2018·0 cites·13 claims
- 4460US7688091B2Chuck with integrated wafer supportCASCADE MICROTECH INC·Filed 2008·Granted Mar 30, 2010·2 cites·19 claims
- 4556US10295565B2Probe card with stress relieving featureCELADON SYSTEMS INC·Filed 2015·Granted May 21, 2019·0 cites·11 claims
- 4655US10254309B2Test apparatus having a probe core with a latch mechanismCELADON SYSTEMS INC·Filed 2014·Granted Apr 9, 2019·0 cites·22 claims
- 4736USD713363SSupport for a probe test coreCELADON SYSTEMS INC·Filed 2013·Granted Sep 16, 2014·3 cites·1 claims
- 4827USD722031STop contact layout board in an electrical systemCELADON SYSTEMS INC·Filed 2013·Granted Feb 3, 2015·0 cites·1 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →