Inventor · disambiguated record

Deborah Leek

Also filed as: LEEK DEBORAH A

1 granted patent·1 pending application·9 citations·filing 2003–2004

31Inventor score

Technology areasG06Q H10P

Files withGATOV MICHAEL S1 LSI LOGIC CORP1

Top patents by PatentIndex Score

2 records

0155US7079966B2Method of qualifying a process tool with wafer defect mapsLSI LOGIC CORP·Filed 2003·Granted Jul 18, 2006·9 cites·10 claims
0254US2006069659A1Defect monitoring systemGATOV MICHAEL S·Filed 2004·Application pending·0 cites

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