Inventor · disambiguated record
John A. Knoch
Also filed as: KNOCH JOHN A
3 granted patents·60 citations·filing 2000–2003
73Inventor score
Top patents by PatentIndex Score
3 records- 0181US7968859B2Wafer edge defect inspection using captured image analysisLSI CORP·Filed 2003·Granted Jun 28, 2011·27 cites·10 claims
- 0275US6512985B1Process control systemLSI LOGIC CORP·Filed 2000·Granted Jan 28, 2003·24 cites·20 claims
- 0355US7079966B2Method of qualifying a process tool with wafer defect mapsLSI LOGIC CORP·Filed 2003·Granted Jul 18, 2006·9 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →