Inventor · disambiguated record
Katsuhiko Kobayashi
Also filed as: KOBAYASHI KATSUHIKO
59 granted patents·8 pending applications·1,339 citations·filing 1985–2022
99Inventor score
Top patents by PatentIndex Score
67 records- 0193US6222195B1Charged-particle-beam exposure device and charged-particle-beam exposure methodFUJITSU LTD·Filed 2000·Granted Apr 24, 2001·49 cites·22 claims
- 0290US6187223B1Polyhaloalkyl ether derivatives as well as liquid crystal compositions and liquid crystal display elements containing themCHISSO CORP·Filed 1999·Granted Feb 13, 2001·38 cites·19 claims
- 0388US8123544B2Electrical connector assembly adapted to withstand rotational movementKOBAYASHI KATSUHIKO·Filed 2010·Granted Feb 28, 2012·22 cites·13 claims
- 0488US6007740APolyhaloalkyl ether derivatives as well as liquid crystal compositions and liquid crystal display elements containing themCHISSO CORP·Filed 1997·Granted Dec 28, 1999·72 cites·20 claims
- 0588US5152759ANoncontact laser microsurgical apparatusUNIV MIAMI SCHOOL OF MEDICINE·Filed 1989·Granted Oct 6, 1992·149 cites·22 claims
- 0687US10505302B2ConnectorTYCO ELECTRONICS JAPAN G K·Filed 2018·Granted Dec 10, 2019·5 cites·9 claims
- 0786US11382231B2Socket connector and cable assembly for a communication systemTYCO ELECTRONICS JAPAN G K·Filed 2020·Granted Jul 5, 2022·2 cites·21 claims
- 0882US5281211ANoncontact laser microsurgical apparatusUNIV MIAMI SCHOOL OF MEDICINE·Filed 1991·Granted Jan 25, 1994·204 cites·18 claims
- 0981US6413109B1Card edge connector having a ground contactWHITAKER CORP·Filed 2000·Granted Jul 2, 2002·26 cites·5 claims
- 1078US10418734B1Contact assembly for a straddle mount connectorTE CONNECTIVITY CORP·Filed 2018·Granted Sep 17, 2019·4 cites·20 claims
- 1178US5391886ACharged particle beam exposure system and method of exposing a pattern on an object by such a charged particle beam exposure systemFUJITSU LTD·Filed 1993·Granted Feb 21, 1995·36 cites·18 claims
- 1276US5865830ANoncontact laser microsurgical apparatusFiled 1995·Granted Feb 2, 1999·121 cites·26 claims
- 1375US5830612AMethod of detecting a deficiency in a charged-particle-beam exposure maskFUJITSU LTD·Filed 1996·Granted Nov 3, 1998·28 cites·11 claims
- 1473US6137111ACharged particle-beam exposure device and charged-particle-beam exposure methodFUJITSU LTD·Filed 1998·Granted Oct 24, 2000·26 cites·41 claims
- 1573US5961881ALiquid crystal composition and liquid crystal display elementCHISSO CORP·Filed 1997·Granted Oct 5, 1999·32 cites·6 claims
- 1672US6176725B1Card edge connectorWHITAKER CORP·Filed 1999·Granted Jan 23, 2001·25 cites·10 claims
- 1771US11456556B2Bracket with an overlapping portion and connector assembly having the bracketTYCO ELECTRONICS JAPAN G K·Filed 2021·Granted Sep 27, 2022·1 cites·11 claims
- 1871US9870499B2Biometric collection deviceNEC CORP·Filed 2015·Granted Jan 16, 2018·2 cites·17 claims
- 1969US7985096B2Connector with switchTYCO ELECTRONICS JAPAN G K·Filed 2010·Granted Jul 26, 2011·1 cites·20 claims
- 2069US7261416B2Eye's optical characteristics measuring systemTOPCON CORP·Filed 2006·Granted Aug 28, 2007·7 cites·9 claims
- 2167US11646518B2Connector with a contact retained in a housingTYCO ELECTRONICS JAPAN G K·Filed 2020·Granted May 9, 2023·0 cites·5 claims
- 2266US7628636B2Electrical connectorTYCO ELECTRONICS AMP KK·Filed 2007·Granted Dec 8, 2009·14 cites·13 claims
- 2366US6273566B1Ophthalmologic characteristic measuring apparatusTOPCON CORP·Filed 2000·Granted Aug 14, 2001·34 cites·5 claims
- 2466US5863213AMemory card connector and adapter thereforWHITAKER CORP·Filed 1997·Granted Jan 26, 1999·24 cites·4 claims
- 2565US11176344B2Biometric collection deviceNEC CORP·Filed 2020·Granted Nov 16, 2021·0 cites·15 claims
- 2663US10784605B2Connector with a contact retained in a housingTYCO ELECTRONICS JAPAN G K·Filed 2018·Granted Sep 22, 2020·1 cites·9 claims
- 2761US6565210B2Ocular optical characteristic measuring apparatusTOPCON CORP·Filed 2001·Granted May 20, 2003·21 cites·4 claims
- 2860US11539153B2ConnectorTYCO ELECTRONICS JAPAN G K·Filed 2019·Granted Dec 27, 2022·1 cites·19 claims
- 2960US11038301B2Connector assembly with a plurality of circuit boardsTYCO ELECTRONICS JAPAN G K·Filed 2020·Granted Jun 15, 2021·0 cites·20 claims
- 3060US7244025B2Eye's optical characteristics measuring systemTOPCON CORP·Filed 2006·Granted Jul 17, 2007·1 cites·8 claims
- 3160US6634899B2Card edge connectorTYCO ELECTRONICS AMP KK·Filed 2001·Granted Oct 21, 2003·14 cites·18 claims
- 3260US6623117B2Eye's optical characteristic measuring systemTOPCON CORP·Filed 2001·Granted Sep 23, 2003·23 cites·11 claims
- 3360US6210399B1Noncontact laser microsurgical methodUNIV MIAMI SCHOOL OF MEDICINE·Filed 1995·Granted Apr 3, 2001·57 cites·24 claims
- 3459US9558380B2Card connectorTYCO ELECTRONICS JAPAN G K·Filed 2014·Granted Jan 31, 2017·1 cites·15 claims
- 3559US6231785B1Benzene derivative and its production methodCHISSO CORP·Filed 1999·Granted May 15, 2001·16 cites·7 claims
- 3657US11794252B2Lamination molding method and lamination molding systemSODICK CO LTD·Filed 2021·Granted Oct 24, 2023·0 cites·17 claims
- 3756US6042233AOptical characteristic measuring apparatusTOPCON CORP·Filed 1998·Granted Mar 28, 2000·76 cites·7 claims
- 3854US10614278B2Biometric collection deviceNEC CORP·Filed 2017·Granted Apr 7, 2020·0 cites·14 claims
- 3954US6699238B1Laser operating systemTOPCON CORP·Filed 2000·Granted Mar 2, 2004·8 cites·4 claims
- 4054US2023104794A1Apparatus and method for additively manufacturing an objectSODICK CO LTD·Filed 2022·Application pending·0 cites
- 4154US2023106603A1Additive manufacturing apparatus and additive manufacturing methodSODICK CO LTD·Filed 2022·Application pending·0 cites
- 4252US9610732B2Lamination molding apparatusSODICK CO LTD·Filed 2015·Granted Apr 4, 2017·0 cites·5 claims
- 4352US4817620ANoncontact type tonometerTOKYO OPTICAL·Filed 1987·Granted Apr 4, 1989·43 cites·9 claims
- 4451US7438601B2ConnectorTYCO ELECTRONICS AMP KK·Filed 2006·Granted Oct 21, 2008·3 cites·9 claims
- 4551US4943512APhotocurable and dyeable resin composition with bisazide and dyeable acrylic copolymerCHISSO CORP·Filed 1988·Granted Jul 24, 1990·9 cites·15 claims
- 4650US6824269B2Eye's optical characteristic measuring systemTOPCON CORP·Filed 2001·Granted Nov 30, 2004·6 cites·3 claims
- 4747US5774615AOptical fiber with a metal layer to maintain the desired shape of the optical fiberTOPCON CORP·Filed 1995·Granted Jun 30, 1998·16 cites·10 claims
- 4847US2023363619A1Endoscope operation support apparatus, control method, computer readable medium, and programNEC CORP·Filed 2020·Application pending·0 cites
- 4947US2024016546A1Endoscope operation support apparatus, control method, computer readable medium, and programNEC CORP·Filed 2020·Application pending·0 cites
- 5046US6789899B2Eye's optical characteristic measuring systemTOPCON CORP·Filed 2001·Granted Sep 14, 2004·1 cites·3 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
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