Inventor · disambiguated record
Kazushi Sugiura
Also filed as: SUGIURA KAZUSHI
17 granted patents·1 pending application·490 citations·filing 1992–2002
95Inventor score
Files withTDK CORP7MITSUBISHI ELECTRIC CORP5RENESAS TECH CORP3RYODEN SEMICONDUCTOR SYST ENG2SEMICONDUCTOR ENERGY LAB1
Top patents by PatentIndex Score
18 records- 0192US6345004B1Repair analysis circuit for redundancy, redundant repairing method, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 5, 2002·86 cites·8 claims
- 0286US5591988ASolid state imaging device with low trap densityTDK CORP·Filed 1995·Granted Jan 7, 1997·59 cites·11 claims
- 0380US6993696B1Semiconductor memory device with built-in self test circuit operating at high rateRYODEN SEMICONDUCTOR SYST ENG·Filed 2000·Granted Jan 31, 2006·30 cites·2 claims
- 0477US6100860AImage display deviceTDK CORP·Filed 1998·Granted Aug 8, 2000·47 cites·10 claims
- 0577US5576222AMethod of making a semiconductor image sensor deviceTDK CORP·Filed 1994·Granted Nov 19, 1996·50 cites·7 claims
- 0671US5574293ASolid state imaging device using disilaneTDK CORP·Filed 1994·Granted Nov 12, 1996·27 cites·4 claims
- 0770US6646461B2Method and apparatus for testing semiconductor devices using improved testing sequenceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 11, 2003·17 cites·7 claims
- 0868US6586823B2Semiconductor device that can have a defective bit found during or after packaging process repairedMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jul 1, 2003·18 cites·13 claims
- 0964US5821560AThin film transistor for controlling a device such as a liquid crystal cell or electroluminescent elementTDK CORP·Filed 1996·Granted Oct 13, 1998·24 cites·10 claims
- 1064US5298455AMethod for producing a non-single crystal semiconductor deviceTDK CORP·Filed 1992·Granted Mar 29, 1994·33 cites·4 claims
- 1163US6452212B1Semiconductor device and method for operating the sameSEMICONDUCTOR ENERGY LAB·Filed 1997·Granted Sep 17, 2002·22 cites·7 claims
- 1263US6311300B1Semiconductor testing apparatus for testing semiconductor device including built in self test circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 30, 2001·22 cites·7 claims
- 1361US6584592B2Semiconductor testing apparatus for testing semiconductor device including built in self test circuitRYODEN SEMICONDUCTOR SYST ENG·Filed 2001·Granted Jun 24, 2003·9 cites·8 claims
- 1460US6724668B2Semiconductor device provided with memory chipsRENESAS TECH CORP·Filed 2002·Granted Apr 20, 2004·12 cites·11 claims
- 1553US5442198ANon-single crystal semiconductor device with sub-micron grain sizeTDK CORP·Filed 1994·Granted Aug 15, 1995·19 cites·7 claims
- 1652US6708302B1Semiconductor moduleRENESAS TECH CORP·Filed 2000·Granted Mar 16, 2004·10 cites·8 claims
- 1743US6990614B1Data storage apparatus and data measuring apparatusRENESAS TECH CORP·Filed 2000·Granted Jan 24, 2006·5 cites·9 claims
- 1835US2003210068A1Apparatus of testing semiconductorMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
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