Inventor · disambiguated record
Duncan Gurley
Also filed as: GURLEY DUNCAN · GURLEY DUNCAN PACKARD
7 granted patents·2 pending applications·55 citations·filing 2005–2015
82Inventor score
Files withVERIGY PTE LTD SINGAPORE3ADVANTEST CORP1DIBATTISTA LARRY JOHN1GURLEY DUNCAN1HILLIGES KLAUS-DIETER1
Top patents by PatentIndex Score
9 records- 0186US7707468B2System and method for electronic testing of multiple memory devicesVERIGY PTE LTD SINGAPORE·Filed 2007·Granted Apr 27, 2010·20 cites·20 claims
- 0284US7250892B2Data converter with integrated MEMS resonator clockVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Jul 31, 2007·18 cites·10 claims
- 0375US7378860B2Wafer test head architecture and method of useVERIGY PTE LTD SINGAPORE·Filed 2006·Granted May 27, 2008·8 cites·14 claims
- 0472US9317351B2System, methods and apparatus using virtual appliances in a semiconductor test environmentHILLIGES KLAUS-DIETER·Filed 2010·Granted Apr 19, 2016·5 cites·24 claims
- 0568US9632109B2Methods, apparatus, and systems for contacting semiconductor dies that are electrically coupled to test access interface positioned in scribe lines of a waferDIBATTISTA LARRY JOHN·Filed 2011·Granted Apr 25, 2017·4 cites·19 claims
- 0648US10025648B2System, methods and apparatus using virtual appliances in a semiconductor test environmentADVANTEST CORP·Filed 2015·Granted Jul 17, 2018·0 cites·20 claims
- 0743US9146274B2Wafer boat for semiconductor testingKHOCHE AJAY·Filed 2007·Granted Sep 29, 2015·0 cites·17 claims
- 0833US2006174177A1Apparatus and method for using MEMS filters to test electronic circuitsWEINSTEIN MICHAEL J·Filed 2005·Application pending·0 cites
- 0931US2008235542A1Electronic testing device for memory devices and related methodsGURLEY DUNCAN·Filed 2007·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →