Inventor · disambiguated record
Michael Geffen
Also filed as: GEFFEN MICHAEL
4 granted patents·62 citations·filing 1998–2016
76Inventor score
Top patents by PatentIndex Score
4 records- 0184US10697908B2Metrology inspection apparatusXWINSYS LTD·Filed 2016·Granted Jun 30, 2020·5 cites·15 claims
- 0278US6934019B2Confocal wafer-inspection systemCAMTEK LTD·Filed 2004·Granted Aug 23, 2005·29 cites·9 claims
- 0365US10697907B2Metrology measuring apparatusXWINSYS LTD·Filed 2016·Granted Jun 30, 2020·2 cites·15 claims
- 0450US6192289B1Method and apparatus for analyzing cutsINSPECTECH LTD·Filed 1998·Granted Feb 20, 2001·26 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →