Inventor · disambiguated record
Terutaka Nanri
Also filed as: NANRI TERUTAKA
4 granted patents·2 pending applications·4 citations·filing 2010–2019
60Inventor score
Top patents by PatentIndex Score
6 records- 0168US9330883B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted May 3, 2016·2 cites·19 claims
- 0264US8933423B2Charged particle beam device and sample production methodNANRI TERUTAKA·Filed 2012·Granted Jan 13, 2015·2 cites·29 claims
- 0343US8680465B2Charged particle beam apparatus and film thickness measurement methodTOMIMATSU SATOSHI·Filed 2010·Granted Mar 25, 2014·0 cites·26 claims
- 0438US2022222775A1Sample observation apparatusHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 0536US10233548B2Charged particle beam device and sample production methodNANRI TERUTAKA·Filed 2011·Granted Mar 19, 2019·0 cites·17 claims
- 0635US2013277552A1Charged particle beam device and method of manufacture of sampleNANRI TERUTAKA·Filed 2011·Application pending·0 cites
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