Inventor · disambiguated record
Sho-Shen Lee
Also filed as: LEE SHO-SHEN
14 granted patents·1 pending application·36 citations·filing 2006–2019
88Inventor score
Top patents by PatentIndex Score
15 records- 0197US9490217B1Overlay marks and semiconductor process using the overlay marksUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 8, 2016·12 cites·20 claims
- 0288US10177094B1Measurement mark and method for monitoring semiconductor processUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 8, 2019·4 cites·13 claims
- 0387US10079185B1Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Sep 18, 2018·4 cites·3 claims
- 0486US10453849B2Dynamic random access memory structure and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Oct 22, 2019·6 cites·6 claims
- 0582US10763264B2Method for forming dynamic random access memory structureUNITED MICROELECTRONICS CORP·Filed 2019·Granted Sep 1, 2020·4 cites·11 claims
- 0673US10529667B1Method of forming overlay mark structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 7, 2020·2 cites·14 claims
- 0767US8954919B1Calculation method for generating layout pattern in photomaskUNITED MICROELECTRONICS CORP·Filed 2013·Granted Feb 10, 2015·2 cites·20 claims
- 0862US10276395B2Method for manufacturing semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 30, 2019·1 cites·9 claims
- 0958US10692785B2Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jun 23, 2020·0 cites·3 claims
- 1055US10373915B1Method for monitoring semiconductor processUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 6, 2019·0 cites·6 claims
- 1155US8524423B2Method of forming assist feature patternsCHIANG YI-CHIH·Filed 2011·Granted Sep 3, 2013·1 cites·16 claims
- 1253US9304389B2Photomask and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 5, 2016·0 cites·20 claims
- 1345US10707092B1Manufacturing method for semiconductor patternUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jul 7, 2020·0 cites·15 claims
- 1443US10707213B2Method of forming layout of semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jul 7, 2020·0 cites·20 claims
- 1541US2007182948A1Semiconductor exposure method and method of controlling semiconductor exposure apparatusLIN BENJAMIN SZU-MIN·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →