Inventor · disambiguated record
Robert S. Ruth
Also filed as: RUTH ROBERT S · RUTH ROBERT SCOTT
8 granted patents·4 pending applications·86 citations·filing 2006–2023
83Inventor score
Files withFREESCALE SEMICONDUCTOR INC3RUTH ROBERT S3ADVANCED MICRO DEVICES INC2ETHERTON MELANIE1HOURS XAVIER1
Top patents by PatentIndex Score
12 records- 0198US9584118B1Substrate bias circuit and method for biasing a substrateFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Feb 28, 2017·65 cites·19 claims
- 0286US9553446B2Shared ESD circuitryFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Jan 24, 2017·7 cites·20 claims
- 0378US9076656B2Electrostatic discharge (ESD) clamp circuit with high effective holding voltageFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Jul 7, 2015·5 cites·18 claims
- 0469US9064938B2I/O cell ESD systemETHERTON MELANIE·Filed 2013·Granted Jun 23, 2015·5 cites·20 claims
- 0566US8765607B2Active tiling placement for improved latch-up immunityRUTH ROBERT S·Filed 2011·Granted Jul 1, 2014·3 cites·14 claims
- 0658US9478529B2Electrostatic discharge protection systemMILLER JAMES W·Filed 2014·Granted Oct 25, 2016·1 cites·20 claims
- 0747US2022415876A1Controlled electrostatic discharging to avoid loading on input/output pinsADVANCED MICRO DEVICES INC·Filed 2021·Application pending·0 cites
- 0846US2025006722A1Integrated circuit low capacitance electrostatic discharge diodesADVANCED MICRO DEVICES INC·Filed 2023·Application pending·0 cites
- 0943US2014264728A1Active Tiling Placement for Improved Latch-up ImmunityRUTH ROBERT S·Filed 2014·Application pending·0 cites
- 1038US11054451B2Electrostatic discharge measuring deviceNXP USA INC·Filed 2019·Granted Jul 6, 2021·0 cites·19 claims
- 1132US9378325B2Method and apparatus for performing integrated circuit layout verificationHOURS XAVIER·Filed 2012·Granted Jun 28, 2016·0 cites·12 claims
- 1227US2008114507A1System and method for situational control of mobile platform maintenance and operationRUTH ROBERT S·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →