Inventor · disambiguated record
Hitoshi Fujiyama
Also filed as: FUJIYAMA HITOSHI
5 granted patents·3 pending applications·19 citations·filing 2005–2023
74Inventor score
Top patents by PatentIndex Score
8 records- 0180US7671609B2Sheet-like probe, method of producing the probe, and application of the probeJSR CORP·Filed 2005·Granted Mar 2, 2010·7 cites·7 claims
- 0276US7737707B2Sheet-like probe, method of producing the probe, and application of the probeJSR CORP·Filed 2005·Granted Jun 15, 2010·5 cites·14 claims
- 0373US7656176B2Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipmentJSR CORP·Filed 2005·Granted Feb 2, 2010·5 cites·7 claims
- 0449US2023031819A1Positioning method and positioning deviceHIRANO SHINYA·Filed 2022·Application pending·0 cites
- 0547US2023302651A1Target detection method and detection device including calibration functionSHIROKI CORP·Filed 2023·Application pending·0 cites
- 0644US12406393B2Target detection method and detection deviceAISIN SHIROKI CORP·Filed 2023·Granted Sep 2, 2025·0 cites·7 claims
- 0739US2007268032A1Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection ApparatusJSR CORP·Filed 2005·Application pending·0 cites
- 0837US8410808B2Anisotropic conductive connector, probe member and wafer inspection systemNAOI MASAYA·Filed 2008·Granted Apr 2, 2013·2 cites·8 claims
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