Inventor · disambiguated record
Yumiko Miyano
Also filed as: MIYANO YUMIKO
15 granted patents·2 pending applications·156 citations·filing 1999–2025
92Inventor score
Top patents by PatentIndex Score
17 records- 0186US2025308985A1Semiconductor deviceKIOXIA CORP·Filed 2025·Application pending·0 cites
- 0285US6647147B1Method for measuring fine pattern, apparatus for measuring fine pattern, and record medium that can store therein program to measure fine pattern and can be read by using computerTOSHIBA KK·Filed 2000·Granted Nov 11, 2003·36 cites·14 claims
- 0384US6480807B1Micropattern measuring method and apparatus, and recording medium that records micropattern measuring programTOSHIBA KK·Filed 2000·Granted Nov 12, 2002·32 cites·8 claims
- 0483US12347723B2Semiconductor deviceKIOXIA CORP·Filed 2023·Granted Jul 1, 2025·0 cites·20 claims
- 0581US9831270B2Nonvolatile semiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 2017·Granted Nov 28, 2017·3 cites·12 claims
- 0680US10115627B2Semiconductor deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Oct 30, 2018·2 cites·18 claims
- 0778US10770471B2Semiconductor deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Sep 8, 2020·3 cites·20 claims
- 0874US6772089B2Graphic contour extracting method, pattern inspecting method, program and pattern inspecting systemTOSHIBA KK·Filed 2002·Granted Aug 3, 2004·29 cites·12 claims
- 0973US11848228B2Semiconductor deviceKIOXIA CORP·Filed 2021·Granted Dec 19, 2023·0 cites·18 claims
- 1061US7787687B2Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and programTOSHIBA KK·Filed 2006·Granted Aug 31, 2010·4 cites·11 claims
- 1161US6363167B1Method for measuring size of fine patternTOSHIBA KK·Filed 1999·Granted Mar 26, 2002·32 cites·20 claims
- 1260US11004731B2Semiconductor deviceTOSHIBA MEMORY CORP·Filed 2018·Granted May 11, 2021·0 cites·12 claims
- 1359US7321680B2Graphic contour extracting method, pattern inspecting method, program and pattern inspecting systemTOSHIBA KK·Filed 2004·Granted Jan 22, 2008·11 cites·8 claims
- 1453US6963819B2Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recordedTOSHIBA KK·Filed 2003·Granted Nov 8, 2005·4 cites·8 claims
- 1544US7418363B2Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recordedTOSHIBA KK·Filed 2005·Granted Aug 26, 2008·0 cites·8 claims
- 1636US2016063138A1Storage Medium Storing Simulation Program, Simulation Device, and Simulation MethodTOSHIBA KK·Filed 2015·Application pending·0 cites
- 1735US8126257B2Alignment of semiconductor wafer patterns by corresponding edge groupsMIYANO YUMIKO·Filed 2007·Granted Feb 28, 2012·0 cites·14 claims
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