Inventor · disambiguated record
Adam Wagman
Also filed as: WAGMAN ADAM · WAGMAN ADAM H
40 granted patents·1,245 citations·filing 1998–2021
98Inventor score
Files withCOGNEX CORP23SILVER WILLIAM M7COGNEX TECH & INVESTMENT CORP6BARKER SIMON2COGNEX TECHNOLOGY AND INVEST1
Top patents by PatentIndex Score
40 records- 0193US7016539B1Method for fast, robust, multi-dimensional pattern recognitionCOGNEX CORP·Filed 1998·Granted Mar 21, 2006·121 cites·35 claims
- 0293US6836567B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Dec 28, 2004·70 cites·23 claims
- 0393US6798925B1Method and apparatus for calibrating an image acquisition systemCOGNEX CORP·Filed 2000·Granted Sep 28, 2004·82 cites·39 claims
- 0493US6658145B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2000·Granted Dec 2, 2003·120 cites·38 claims
- 0591US7162073B1Methods and apparatuses for detecting classifying and measuring spot defects in an image of an objectCOGNEX TECH & INVESTMENT CORP·Filed 2001·Granted Jan 9, 2007·127 cites·21 claims
- 0690US7181066B1Method for locating bar codes and symbols in an imageCOGNEX TECH & INVESTMENT CORP·Filed 2002·Granted Feb 20, 2007·104 cites·23 claims
- 0790US6798515B1Method for calculating a scale relationship for an imaging systemCOGNEX TECH & INVESTMENT CORP·Filed 2001·Granted Sep 28, 2004·29 cites·40 claims
- 0889US8229222B1Method for fast, robust, multi-dimensional pattern recognitionSILVER WILLIAM M·Filed 2004·Granted Jul 24, 2012·30 cites·27 claims
- 0989US6850646B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Feb 1, 2005·77 cites·60 claims
- 1087US6941016B1Method for finding contours in an image of an objectCOGNEX TECHNOLOGY AND INVEST·Filed 2001·Granted Sep 6, 2005·70 cites·30 claims
- 1186US10452949B2System and method for scoring clutter for use in 3D point cloud matching in a vision systemCOGNEX CORP·Filed 2015·Granted Oct 22, 2019·8 cites·21 claims
- 1286US6856698B1Fast high-accuracy multi-dimensional pattern localizationCOGNEX CORP·Filed 2002·Granted Feb 15, 2005·64 cites·20 claims
- 1385US8363972B1Method for fast, robust, multi-dimensional pattern recognitionCOGNEX CORP·Filed 2004·Granted Jan 29, 2013·19 cites·35 claims
- 1484US8867847B2Method for fast, robust, multi-dimensional pattern recognitionSILVER WILLIAM M·Filed 2012·Granted Oct 21, 2014·3 cites·16 claims
- 1584US7065262B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Jun 20, 2006·29 cites·55 claims
- 1681US7088862B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Aug 8, 2006·24 cites·30 claims
- 1781US6751361B1Method and apparatus for performing fixturing in a machine vision systemCOGNEX CORP·Filed 2000·Granted Jun 15, 2004·47 cites·29 claims
- 1878US10482621B2System and method for improved scoring of 3D poses and spurious point removal in 3D image dataCOGNEX CORP·Filed 2017·Granted Nov 19, 2019·3 cites·20 claims
- 1978US8363942B1Method for fast, robust, multi-dimensional pattern recognitionCOGNEX TECH & INVESTMENT CORP·Filed 2004·Granted Jan 29, 2013·11 cites·27 claims
- 2077US8270748B1Method for fast, robust, multi-dimensional pattern recognitionSILVER WILLIAM M·Filed 2004·Granted Sep 18, 2012·10 cites·22 claims
- 2176US6959112B1Method for finding a pattern which may fall partially outside an imageCOGNEX TECH & INVESTMENT CORP·Filed 2001·Granted Oct 25, 2005·34 cites·11 claims
- 2275US10957072B2System and method for simultaneous consideration of edges and normals in image features by a vision systemCOGNEX CORP·Filed 2018·Granted Mar 23, 2021·2 cites·20 claims
- 2375US8254695B1Method for fast, robust, multi-dimensional pattern recognitionSILVER WILLIAM M·Filed 2004·Granted Aug 28, 2012·9 cites·23 claims
- 2474US8363956B1Method for fast, robust, multi-dimensional pattern recognitionCOGNEX CORP·Filed 2004·Granted Jan 29, 2013·9 cites·16 claims
- 2574US8295613B1Method for fast, robust, multi-dimensional pattern recognitionSILVER WILLIAM M·Filed 2004·Granted Oct 23, 2012·8 cites·19 claims
- 2673US8457390B1Method and apparatus for training a probe model based machine vision systemBARKER SIMON·Filed 2008·Granted Jun 4, 2013·10 cites·41 claims
- 2773US7251366B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Jul 31, 2007·18 cites·34 claims
- 2872US8335380B1Method for fast, robust, multi-dimensional pattern recognitionSILVER WILLIAM M·Filed 2004·Granted Dec 18, 2012·7 cites·25 claims
- 2972US8320675B1Method for fast, robust, multi-dimensional pattern recognitionSILVER WILLIAM M·Filed 2004·Granted Nov 27, 2012·7 cites·42 claims
- 3072US7164796B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Jan 16, 2007·13 cites·42 claims
- 3172US6975764B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX TECH & INVESTMENT CORP·Filed 2003·Granted Dec 13, 2005·14 cites·34 claims
- 3271US7043081B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted May 9, 2006·13 cites·70 claims
- 3371US7006712B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Feb 28, 2006·13 cites·31 claims
- 3470US6985625B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Jan 10, 2006·12 cites·30 claims
- 3569US11881000B2System and method for simultaneous consideration of edges and normals in image features by a vision systemCOGNEX CORP·Filed 2021·Granted Jan 23, 2024·0 cites·19 claims
- 3668US6993192B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Jan 31, 2006·11 cites·39 claims
- 3761US6606402B2System and method for in-line inspection of stencil aperture blockageCOGNEX CORP·Filed 2001·Granted Aug 12, 2003·9 cites·15 claims
- 3860US7058225B1Fast high-accuracy multi-dimensional pattern inspectionCOGNEX CORP·Filed 2003·Granted Jun 6, 2006·6 cites·45 claims
- 3950US9412158B2Method of configuring a machine vision application program for execution on a multi-processor computerDAVIS JASON ADAM·Filed 2008·Granted Aug 9, 2016·2 cites·21 claims
- 4046US8705851B2Method and apparatus for training a probe model based machine vision systemBARKER SIMON·Filed 2013·Granted Apr 22, 2014·0 cites·18 claims
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