Inventor · disambiguated record
Kuang-Jung Li
Also filed as: LI KUANG-JUNG
3 granted patents·11 citations·filing 2005–2010
62Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0179US7374293B2Apparatus, system and method for testing electronic elementsVISHAY GENERAL SEMICONDUCTOR I·Filed 2005·Granted May 20, 2008·9 cites·14 claims
- 0263US7671611B2Apparatus, system and method for testing electronic elementsVISHAY GEN SEMICONDUCTOR LLC·Filed 2008·Granted Mar 2, 2010·2 cites·5 claims
- 0338US8130006B2Apparatus, system and method for testing electronic elementsLI KUANG-JUNG·Filed 2010·Granted Mar 6, 2012·0 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →