Inventor · disambiguated record
Michael E. Fossey
Also filed as: FOSSEY MICHAEL E · FOSSEY MICHEAL E
13 granted patents·2 pending applications·751 citations·filing 1983–2007
94Inventor score
Top patents by PatentIndex Score
15 records- 0194US6292259B1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2000·Granted Sep 18, 2001·78 cites·42 claims
- 0293US6118525AWafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 1997·Granted Sep 12, 2000·122 cites·21 claims
- 0392US5712701ASurface inspection system and method of inspecting surface of workpieceADE OPTICAL SYST CORP·Filed 1995·Granted Jan 27, 1998·164 cites·42 claims
- 0490US7705879B2System for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operationMAX VIZ INC·Filed 2007·Granted Apr 27, 2010·35 cites·27 claims
- 0589US6509965B2Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2001·Granted Jan 21, 2003·38 cites·16 claims
- 0686US5988971AWafer transfer robotADE OPTICAL SYST CORP·Filed 1997·Granted Nov 23, 1999·87 cites·23 claims
- 0783US4916536AImaging range finder and methodFLIR SYSTEMS·Filed 1988·Granted Apr 10, 1990·50 cites·14 claims
- 0881US5361268ASwitchable two-wavelength frequency-converting laser system and power control thereforELECTRO SCIENT IND INC·Filed 1993·Granted Nov 1, 1994·58 cites·43 claims
- 0975USRE45452ESystem for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operationMAX VIZ INC·Filed 2007·Granted Apr 7, 2015·4 cites·39 claims
- 1071US6122047AMethods and apparatus for identifying the material of a particle occurring on the surface of a substrateADE OPTICAL SYST CORP·Filed 1999·Granted Sep 19, 2000·37 cites·32 claims
- 1170US4698785AMethod and apparatus for detecting control system data processing errorsDESMOND JOHN P·Filed 1983·Granted Oct 6, 1987·41 cites·27 claims
- 1266US5565852ASmoke detector with digital displaySENTROL INC·Filed 1994·Granted Oct 15, 1996·37 cites·22 claims
- 1346USRE44604ESystem for and method of synchronous acquisition of pulsed source light in performance of monitoring aircraft flight operationKERR J RICHARD·Filed 2007·Granted Nov 19, 2013·0 cites·27 claims
- 1442US2004085533A1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2003·Application pending·0 cites
- 1541US2003071992A1Wafer inspection system for distinguishing pits and particlesADE OPTICAL SYST CORP·Filed 2002·Application pending·0 cites
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