Inventor · disambiguated record

Shinsuke Ueyama

Also filed as: UEYAMA SHINSUKE

1 granted patent·2 citations·filing 2011–2011

18Inventor score

Technology areasH10P

Files withOKADA MASAKUNI1

Top patents by PatentIndex Score

1 record

0159US8630476B2System and method for supporting discovery of defect included in inspection subjectOKADA MASAKUNI·Filed 2011·Granted Jan 14, 2014·2 cites·12 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →