Inventor · disambiguated record
Ching-Ren Cheng
Also filed as: CHENG CHING-REN
1 granted patent·1 pending application·1 citations·filing 2014–2015
16Inventor score
Files withMACRONIX INT CO LTD2
Top patents by PatentIndex Score
2 records- 0155US9435847B2Method for testing special pattern and probe card defect in wafer testingMACRONIX INT CO LTD·Filed 2014·Granted Sep 6, 2016·1 cites·10 claims
- 0217US2016292845A1Determining contact edge roughness of a contact hole etched in a waferMACRONIX INT CO LTD·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →