Inventor · disambiguated record
Kai-Wen Tu
Also filed as: TU KAI-WEN
1 granted patent·2 pending applications·1 citations·filing 2008–2014
16Inventor score
Files withMACRONIX INT CO LTD3
Top patents by PatentIndex Score
3 records- 0155US9435847B2Method for testing special pattern and probe card defect in wafer testingMACRONIX INT CO LTD·Filed 2014·Granted Sep 6, 2016·1 cites·10 claims
- 0238US2010014745A1Inspecting method and inspecting equipmentMACRONIX INT CO LTD·Filed 2008·Application pending·0 cites
- 0334US2014011306A1Inspecting method and inspecting equipmentMACRONIX INT CO LTD·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →