Inventor · disambiguated record
Eyal Rot
Also filed as: Rot Eyal
2 granted patents·1 citations·filing 2015–2022
30Inventor score
Top patents by PatentIndex Score
2 records- 0177US12223641B2Defect detection of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Feb 11, 2025·1 cites·20 claims
- 0242US9646350B1System, method, and computer program for performing operations on network files including captured billing event informationAMDOCS SOFTWARE SYSTEMS LTD·Filed 2015·Granted May 9, 2017·0 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →