Inventor · disambiguated record
Ian Christopher Mayes
Also filed as: MAYES IAN · MAYES IAN C · MAYES IAN CHRISTOPHER
9 granted patents·112 citations·filing 1994–2017
86Inventor score
Top patents by PatentIndex Score
9 records- 0190US7446868B1Micro defects in semi-conductorsNANOMETRICS INC·Filed 2006·Granted Nov 4, 2008·29 cites·20 claims
- 0278US7113276B1Micro defects in semi-conductorsASTI OPERATING COMPANY INC·Filed 1997·Granted Sep 26, 2006·58 cites·20 claims
- 0364US9482605B2Bond testing machine and cartridge for a bond testing machine comprising a plurality of test toolsNORDSON CORP·Filed 2014·Granted Nov 1, 2016·2 cites·28 claims
- 0464US7556725B2Sealing ring assembly and mounting methodNANOMETRICS INC·Filed 2005·Granted Jul 7, 2009·2 cites·14 claims
- 0563US8680852B2Method and apparatus for phase sensitive detection of eddy current measurementsDALY ALAN·Filed 2009·Granted Mar 25, 2014·4 cites·19 claims
- 0654US7842179B2Sealing ring assembly and mounting methodNANOMETRICS INC·Filed 2009·Granted Nov 30, 2010·0 cites·5 claims
- 0750US11579058B2Bond test apparatus and method for testing the strength of bonds on electrical circuitryNORDSON CORP·Filed 2017·Granted Feb 14, 2023·0 cites·18 claims
- 0840US5797114AMethod and apparatus for mapping of semiconductor materialsUNIV SHEFFIELD·Filed 1994·Granted Aug 18, 1998·17 cites·15 claims
- 0932US7713404B2Monitoring apparatus and method for improving the accuracy and repeatability of electrochemical capacitance voltage (ECV) measurementsNANOMETRICS INC·Filed 2003·Granted May 11, 2010·0 cites·7 claims
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