Inventor · disambiguated record
Ryoji Ikebe
Also filed as: IKEBE RYOJI
7 granted patents·1 pending application·4 citations·filing 2006–2021
73Inventor score
Technology areasH10P
Top patents by PatentIndex Score
8 records- 0176US10217628B2Substrate processing apparatus and processing method of substrate processing apparatusTOKYO ELECTRON LTD·Filed 2017·Granted Feb 26, 2019·2 cites·12 claims
- 0275US10707109B2Substrate processing apparatusTOKYO ELECTRON LTD·Filed 2018·Granted Jul 7, 2020·2 cites·13 claims
- 0369US12300524B2Substrate processing systemTOKYO ELECTRON LTD·Filed 2021·Granted May 13, 2025·0 cites·4 claims
- 0460US11018035B2Substrate processing systemTOKYO ELECTRON LTD·Filed 2018·Granted May 25, 2021·0 cites·10 claims
- 0555US10128137B2Management method of substrate processing apparatus and substrate processing systemTOKYO ELECTRON LTD·Filed 2017·Granted Nov 13, 2018·0 cites·15 claims
- 0639US11011436B2Substrate processing apparatus, control method of substrate processing apparatus and substrate processing systemTOKYO ELECTRON LTD·Filed 2017·Granted May 18, 2021·0 cites·9 claims
- 0736US2006279306A1Test equipment of semiconductor devicesSTK TECHNOLOGY LTD·Filed 2006·Application pending·0 cites
- 0835US10713772B2Measurement processing device, substrate processing system, measurement jig, measurement processing method, and storage mediumTOKYO ELECTRON LTD·Filed 2015·Granted Jul 14, 2020·0 cites·21 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →