Inventor · disambiguated record
Juhyung Kim
Also filed as: KIM JUHYUNG
3 granted patents·9 pending applications·42 citations·filing 2011–2024
68Inventor score
Top patents by PatentIndex Score
12 records- 0195US9130054B2Semiconductor memory devices and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Sep 8, 2015·29 cites·15 claims
- 0283US8599622B2Charge trap flash memory device and an erasing method thereofKIM JUHYUNG·Filed 2011·Granted Dec 3, 2013·13 cites·16 claims
- 0363US2025220905A1Semiconductor device and electronic system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0457US2025301644A1Semiconductor device and electronic system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0557US2025048632A1Semiconductor devices and data storage systems including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0657US2025275149A1Semiconductor device and electronic system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0755US2025248104A1Three-dimensional semiconductor memory device and electronic system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0854US2024023340A1Semiconductor device and data storage system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0951US2024224535A1Semiconductor memory device and electronic system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1050US10109747B2Semiconductor memory devices and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Oct 23, 2018·0 cites·19 claims
- 1149US2025182806A1Non-volatile memory devices and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1234US2014048868A1Three-dimensional semiconductor memory device and a method of manufacturing the sameKIM JUHYUNG·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →