Inventor · disambiguated record
Rainer Leitgeb
Also filed as: LEITGEB RAINER · LEITGEB RAINER A
9 granted patents·6 pending applications·141 citations·filing 2005–2025
87Inventor score
Files withZEISS CARL MEDITEC AG6ZEISS CARL MEDITEC INC4LEITGEB RAINER3EXALOS AG1FERCHER ADOLF FRIEDRICH1
Top patents by PatentIndex Score
15 records- 0197US7982881B2Apparatus and method for interferometric measurement of a sampleZEISS CARL MEDITEC AG·Filed 2006·Granted Jul 19, 2011·81 cites·24 claims
- 0287US9247874B2Systems and methods for sub-aperture based aberration measurement and correction in interferometric imagingZEISS CARL MEDITEC INC·Filed 2014·Granted Feb 2, 2016·21 cites·36 claims
- 0386US8437008B2Interferometric sample measurementFERCHER ADOLF FRIEDRICH·Filed 2011·Granted May 7, 2013·12 cites·2 claims
- 0485US9775511B2Systems and methods for sub-aperture based aberration measurement and correction in interferometric imagingZEISS CARL MEDITEC INC·Filed 2014·Granted Oct 3, 2017·17 cites·25 claims
- 0585US9046339B2Systems and methods for bidirectional functional optical coherence tomographyZEISS CARL MEDITEC INC·Filed 2014·Granted Jun 2, 2015·9 cites·15 claims
- 0679US2025314584A1Method for controlling a semiconductor-laser-diode-based ss-interferometer systemZEISS CARL MEDITEC AG·Filed 2025·Application pending·0 cites
- 0767US2025264323A1Method for compensating the artifacts generated by moving measurement objects in measurement signals of swept-source oct systemsZEISS CARL MEDITEC AG·Filed 2025·Application pending·0 cites
- 0866US12372462B2Method for controlling a semiconductor-laser-diode-based SS-interferometer systemZEISS CARL MEDITEC AG·Filed 2020·Granted Jul 29, 2025·0 cites·19 claims
- 0965US11086133B2Source module and optical system for line-field imagingEXALOS AG·Filed 2019·Granted Aug 10, 2021·1 cites·8 claims
- 1060US10231616B2Systems and methods for sub-aperture based aberration measurement and correction in interferometric imagingZEISS CARL MEDITEC INC·Filed 2017·Granted Mar 19, 2019·0 cites·30 claims
- 1156US2024111143A1Method for operating a microscopy system, microscopy system, and calibration method for a microscopy systemZEISS CARL MEDITEC AG·Filed 2023·Application pending·0 cites
- 1252US12313402B2Method for compensating the artifacts generated by moving measurement objects in measurement signals of swept-source OCT systemsZEISS CARL MEDITEC AG·Filed 2019·Granted May 27, 2025·0 cites·30 claims
- 1332US2010141956A1Dual beam heterodyne fourier domain optical coherence tomographyLEITGEB RAINER·Filed 2008·Application pending·0 cites
- 1431US2009128824A1Optical imaging system with extended depth of focusLEITGEB RAINER·Filed 2007·Application pending·0 cites
- 1529US2009015842A1Phase Sensitive Fourier Domain Optical Coherence TomographyLEITGEB RAINER·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →