Inventor · disambiguated record
Woo-Seop Kim
Also filed as: KIM WOO SEOP
13 granted patents·4 pending applications·111 citations·filing 1996–2025
91Inventor score
Top patents by PatentIndex Score
17 records- 0188US7598762B2Semiconductor driver circuit with signal swing balance and enhanced testingSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 6, 2009·22 cites·17 claims
- 0286USD946474SFront bumper for an automobileKIA MOTORS CORP·Filed 2020·Granted Mar 22, 2022·11 cites·1 claims
- 0383US7656181B2Apparatus and method for testing circuit characteristics by using eye maskSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 2, 2010·11 cites·22 claims
- 0481US6972597B2Simultaneous bidirectional input/output circuit and methodSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Dec 6, 2005·35 cites·21 claims
- 0579US2025377411A1Early diagnosis apparatus and early diagnosis method for foil breakage of batterySK ON CO LTD·Filed 2025·Application pending·0 cites
- 0673US7484968B2Socket for an electrical testerSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Feb 3, 2009·4 cites·18 claims
- 0769US7692998B2Circuit of detecting power-up and power-downSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 6, 2010·7 cites·24 claims
- 0868US7512024B2High-speed memory device easily testable by low-speed automatic test equipment and input/output pin control method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 31, 2009·6 cites·20 claims
- 0965US8786067B2Semiconductor package having improved heat spreading performancePAEK SOO-JIN·Filed 2011·Granted Jul 22, 2014·3 cites·18 claims
- 1064US2025290992A1Method and system for detecting defect of battery in battery formation processSK ON CO LTD·Filed 2025·Application pending·0 cites
- 1161US9026870B2Memory module and a memory test system for testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted May 5, 2015·2 cites·19 claims
- 1258US7436199B2Stack-type semiconductor package sockets and stack-type semiconductor package test systemsSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 14, 2008·1 cites·23 claims
- 1357US7973400B2Semiconductor package having improved heat spreading performanceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jul 5, 2011·1 cites·15 claims
- 1443US2007146331A1Remote controller and display systemSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1539US5856982AHigh-speed disturb testing method and word line decoder in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jan 5, 1999·8 cites·11 claims
- 1637US7555686B2Semiconductor device, test board for testing the same, and test system and method for testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 30, 2009·0 cites·24 claims
- 1736US2012025861A1Test socket and test device having the samePARK HWAN WOOK·Filed 2011·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →