Inventor · disambiguated record
Hironori Sakurai
Also filed as: SAKURAI HIRONORI
4 granted patents·5 citations·filing 2014–2019
61Inventor score
Top patents by PatentIndex Score
4 records- 0187US10861145B2Defect inspection device and defect inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 8, 2020·4 cites·9 claims
- 0267US10466181B2Flaw inspection device and flaw inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Nov 5, 2019·1 cites·15 claims
- 0357US10816484B2Flaw inspection device and flaw inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 27, 2020·0 cites·8 claims
- 0444US9408528B2Stereoscopic endoscope systemOLYMPUS CORP·Filed 2014·Granted Aug 9, 2016·0 cites·4 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →