Inventor · disambiguated record

Takayuki Takao

Also filed as: TAKAO TAKAYUKI

2 granted patents·28 citations·filing 2001–2006

54Inventor score

Technology areasG01R

Files withAGILENT TECHNOLOGIES INC2

Top patents by PatentIndex Score

2 records

0173US6639417B2Semiconductor parametric testing apparatusAGILENT TECHNOLOGIES INC·Filed 2001·Granted Oct 28, 2003·28 cites·5 claims
0235US7535243B2Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under testAGILENT TECHNOLOGIES INC·Filed 2006·Granted May 19, 2009·0 cites·4 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →