Inventor · disambiguated record
Hiromi Inada
Also filed as: INADA HIROMI
20 granted patents·123 citations·filing 2001–2014
94Inventor score
Top patents by PatentIndex Score
20 records- 0192US7372051B2Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement systemHITACHI HIGH TECH CORP·Filed 2005·Granted May 13, 2008·19 cites·10 claims
- 0289US8878130B2Scanning electron microscope and scanning transmission electron microscopeINADA HIROMI·Filed 2012·Granted Nov 4, 2014·12 cites·12 claims
- 0388US7633064B2Electric charged particle beam microscopy and electric charged particle beam microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Dec 15, 2009·11 cites·13 claims
- 0486US7435957B2Charged particle beam equipment and charged particle microscopyHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 14, 2008·8 cites·22 claims
- 0586USD571385SElectron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 17, 2008·11 cites·1 claims
- 0679US7923701B2Charged particle beam equipmentHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 12, 2011·4 cites·14 claims
- 0779US7375330B2Charged particle beam equipmentHITACHI HIGH TECH CORP·Filed 2006·Granted May 20, 2008·4 cites·13 claims
- 0876US9305745B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 5, 2016·3 cites·9 claims
- 0975US7649172B2Charged particle beam equipment with magnification correctionHITACHI HIGH TECH CORP·Filed 2007·Granted Jan 19, 2010·5 cites·14 claims
- 1073US7126120B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Oct 24, 2006·10 cites·16 claims
- 1170US7372047B2Charged particle system and a method for measuring image magnificationHITACHI HIGH TECH CORP·Filed 2005·Granted May 13, 2008·2 cites·19 claims
- 1267US7544936B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2006·Granted Jun 9, 2009·4 cites·1 claims
- 1367US7164129B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2005·Granted Jan 16, 2007·4 cites·26 claims
- 1462US7022989B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2004·Granted Apr 4, 2006·10 cites·3 claims
- 1559US9709457B2Method of detecting defects in honeycomb structural bodyDENSO CORP·Filed 2014·Granted Jul 18, 2017·1 cites·9 claims
- 1658US8304722B2Charged particle beam equipment and charged particle microscopyINADA HIROMI·Filed 2008·Granted Nov 6, 2012·0 cites·3 claims
- 1758US6878934B2Method and device for observing a specimen in a field of view of an electronHITACHI LTD·Filed 2001·Granted Apr 12, 2005·8 cites·36 claims
- 1855US7112294B2Method of producing ceramic bodyDENSO CORP·Filed 2002·Granted Sep 26, 2006·3 cites·3 claims
- 1951US7012254B2Method and device for observing a specimen in a field of view of an electron microscopeHITACHI LTD·Filed 2004·Granted Mar 14, 2006·4 cites·3 claims
- 2041US8710438B2Scanning transmission electron microscope and axial adjustment method thereofNAKAMURA KUNIYASU·Filed 2011·Granted Apr 29, 2014·0 cites·6 claims
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