Inventor · disambiguated record
Gerhard Hoppen
Also filed as: HOPPEN GERHARD
5 granted patents·27 citations·filing 2000–2010
77Inventor score
Top patents by PatentIndex Score
5 records- 0174US8451440B2Apparatus for the optical inspection of wafersHAHN KURT·Filed 2010·Granted May 28, 2013·4 cites·35 claims
- 0261US6975409B2Illumination device; and coordinate measuring instrument having an illumination deviceLEICA MICROSYSTEMS·Filed 2001·Granted Dec 13, 2005·6 cites·3 claims
- 0360US7050223B1DUV-capable microscope objective with parfocal IR focusLEICA MICROSYSTEMS·Filed 2000·Granted May 23, 2006·9 cites·26 claims
- 0453US7209243B2Illumination device, and coordinate measuring instrument having an illumination deviceLEICA MICROSYSTEMS·Filed 2004·Granted Apr 24, 2007·4 cites·6 claims
- 0550US7019910B2Inspection microscope and objective for an inspection microscopeLEICA MICROSYSTEMS·Filed 2002·Granted Mar 28, 2006·4 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →