Inventor · disambiguated record
Peter Beer
Also filed as: BEER PETER
40 granted patents·10 pending applications·451 citations·filing 2000–2008
97Inventor score
Top patents by PatentIndex Score
50 records- 0196US7231562B2Memory module, test system and method for testing one or a plurality of memory modulesINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 12, 2007·158 cites·21 claims
- 0288US6612738B2Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measuring configurationINFINEON TECHNOLOGIES·Filed 2001·Granted Sep 2, 2003·45 cites·5 claims
- 0385US6829185B2Method for precharging memory cells of a dynamic semiconductor memory during power-up and semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 7, 2004·37 cites·10 claims
- 0477US6756787B2Integrated circuit having a current measuring unitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 29, 2004·21 cites·9 claims
- 0572US6671221B2Semiconductor chip with trimmable oscillatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 30, 2003·19 cites·9 claims
- 0667US7038956B2Apparatus and method for reading out defect information items from an integrated chipINFINEON TECHNOLOGIES AG·Filed 2004·Granted May 2, 2006·15 cites·16 claims
- 0766US7490274B2Method and apparatus for masking known fails during memory tests readoutsINFINEON TECHNOLOGIES AG·Filed 2006·Granted Feb 10, 2009·5 cites·4 claims
- 0864US7205596B2Adiabatic rotational switching memory element including a ferromagnetic decoupling layerINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 17, 2007·3 cites·7 claims
- 0963US7137049B2Method and apparatus for masking known fails during memory tests readoutsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 14, 2006·11 cites·13 claims
- 1063US6657452B2Configuration for measurement of internal voltages of an integrated semiconductor apparatusINFINEON TECHNOLOGIES AG·Filed 2000·Granted Dec 2, 2003·11 cites·10 claims
- 1162US7088612B2MRAM with vertical storage element in two layer-arrangement and field sensorINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 8, 2006·11 cites·27 claims
- 1260US6737695B2Memory module having a memory cell and method for fabricating the memory moduleINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 18, 2004·9 cites·10 claims
- 1359US7302622B2Integrated memory having a test circuit for functional testing of the memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 27, 2007·10 cites·8 claims
- 1459US6891431B2Integrated semiconductor circuit configurationINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 10, 2005·8 cites·21 claims
- 1557US6740917B2Integrated semiconductor memory fabrication methodINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 25, 2004·6 cites·10 claims
- 1656US7107501B2Test device, test system and method for testing a memory circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Sep 12, 2006·9 cites·10 claims
- 1756US6858447B2Method for testing semiconductor chipsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 22, 2005·7 cites·7 claims
- 1854US7159156B2Memory chip with test logic taking into consideration the address of a redundant word line and method for testing a memory chipINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 2, 2007·8 cites·2 claims
- 1953US6728147B2Method for on-chip testing of memory cells of an integrated memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 27, 2004·8 cites·12 claims
- 2052US6831320B2Memory cell configuration for a DRAM memory with a contact bit terminal for two trench capacitors of different rowsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 14, 2004·5 cites·16 claims
- 2152US6670665B2Memory module with improved electrical propertiesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 30, 2003·5 cites·10 claims
- 2250US6639861B2Integrated memory and method for testing an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 28, 2003·7 cites·7 claims
- 2349US7197678B2Test circuit and method for testing an integrated memory circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 27, 2007·6 cites·12 claims
- 2449US7009869B2Dynamic memory cellINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 7, 2006·3 cites·20 claims
- 2546US7162663B2Test system and method for testing memory circuitsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 9, 2007·5 cites·8 claims
- 2646US2007276872A1System and method for automated and structured transfer of technical documents and the management of the transferred documents in a databaseABB TECHNOLOGY AG·Filed 2007·Application pending·0 cites
- 2745US8051048B2System and method for automated transfer and evaluation of the quality of mass data of a technical process or a technical projectABB TECHNOLOGY AG·Filed 2007·Granted Nov 1, 2011·0 cites·16 claims
- 2845US2008004932A1System and method for quantity-related comparison between planning and default data of a technical process or a technical projectABB TECHNOLOGY AG·Filed 2007·Application pending·0 cites
- 2944US2006129879A1System and method for monitoring the status and progress of a technical process or of a technical projectABB PATENT GMBH·Filed 2005·Application pending·0 cites
- 3043US6985390B2Integrated memory circuit having a redundancy circuit and a method for replacing a memory areaINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jan 10, 2006·3 cites·20 claims
- 3143US6754110B2Evaluation circuit for a DRAMINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 22, 2004·4 cites·7 claims
- 3240US6813200B2Circuit configuration for reading out a programmable linkINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 2, 2004·2 cites·6 claims
- 3339US6922365B2Read-out circuit for a dynamic memory circuit, memory cell array, and method for amplifying and reading data stored in a memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 26, 2005·2 cites·9 claims
- 3439US6862234B2Method and test circuit for testing a dynamic memory circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Mar 1, 2005·4 cites·20 claims
- 3539US6636447B2Memory module, method for activating a memory cell, and method for repairing a defective memory cellINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 21, 2003·2 cites·10 claims
- 3638US7929362B2Integrated semiconductor memory with distributor line for redundant data linesQIMONDA AG·Filed 2007·Granted Apr 19, 2011·0 cites·29 claims
- 3738US7573761B2Integrated electrical module with regular and redundant elementsQIMONDA AG·Filed 2007·Granted Aug 11, 2009·0 cites·19 claims
- 3838US7468910B2Method for accessing a memoryQIMONDA AG·Filed 2007·Granted Dec 23, 2008·0 cites·12 claims
- 3938US6639856B2Memory chip having a test mode and method for checking memory cells of a repaired memory chipINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 28, 2003·2 cites·7 claims
- 4037US2009268505A1Method of Operating an Integrated Circuit, and Integrated CircuitBEER PETER·Filed 2008·Application pending·0 cites
- 4135US7821856B2Memory device having an evaluation circuitQIMODA AG·Filed 2008·Granted Oct 26, 2010·0 cites·8 claims
- 4233US7080297B2Memory circuit and method for reading out dataINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 18, 2006·0 cites·8 claims
- 4333US6784683B2Circuit configuration for selectively transmitting information items from a measuring device to chips on a wafer during chip fabricationINFINEON TECHNOLOGIES AG·Filed 2002·Granted Aug 31, 2004·0 cites·14 claims
- 4433US2004153947A1Method for writing to a defect address memory, and test circuit having a defect address memoryFiled 2003·Application pending·0 cites
- 4532US7380182B2Method and apparatus for checking output signals of an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted May 27, 2008·0 cites·6 claims
- 4632US2004062103A1Memory circuit with a test mode for writing test dataFiled 2003·Application pending·0 cites
- 4732US2004057307A1Self-test circuit and a method for testing a memory with the self-test circuitFiled 2003·Application pending·0 cites
- 4832US2004013013A1Memory, module with crossed bit lines, and method for reading the memory moduleFiled 2003·Application pending·0 cites
- 4931US2004057302A1Test circuit of an integrated memory circuit for coding assessment data and method for testing the memory circuitFiled 2003·Application pending·0 cites
- 5027US2003002351A1Integrated memory circuit and method for reading a data item from a memory cellFiled 2002·Application pending·0 cites
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