Inventor · disambiguated record
Seongkwan Lee
Also filed as: LEE SEONGKWAN
6 granted patents·5 pending applications·0 citations·filing 2015–2024
64Inventor score
Top patents by PatentIndex Score
11 records- 0157US2025123323A1Semiconductor test device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0253US12105146B2Wafer-level multi-device tester and system including the same preliminary classSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 1, 2024·0 cites·11 claims
- 0352US2024319265A1Semiconductor test devices, systems including the same, and methods for testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0452US2025138088A1Probe card including power compensation circuit and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0551US12309353B2Image sensor test system including operational amplifier and low-frequency attenuatorSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted May 20, 2025·0 cites·18 claims
- 0651US2024053391A1Apparatus for testing image sensor and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0751US2025076381A1Receiving circuit in test device, test system having the same, and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0848US10994206B2Apparatus and method for controlling objectNEXON KOREA CORP·Filed 2019·Granted May 4, 2021·0 cites·17 claims
- 0947US12328424B2Interface board for testing image sensor, test system having the same, and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 10, 2025·0 cites·18 claims
- 1045US11843487B2High performance receivers for mobile industry processor interfaces (MIPI) and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 12, 2023·0 cites·5 claims
- 1141US10315112B2Apparatus and method for controlling objectNEXON KOREA CORP·Filed 2015·Granted Jun 11, 2019·0 cites·19 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →