Inventor · disambiguated record

Christiaan Theodoor De Ruiter

Also filed as: DE RUITER CHRISTIAAN THEODOOR

3 granted patents·2 citations·filing 2017–2021

54Inventor score

Technology areasG03F

Files withASML NETHERLANDS BV3

Top patents by PatentIndex Score

3 records

0174US11086229B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Aug 10, 2021·1 cites·24 claims
0270US11714357B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
0370US10816907B2Method for determining an optimized set of measurement locations for measurement of a parameter of a lithographic process, metrology system and computer program products for implementing such methodsASML NETHERLANDS BV·Filed 2017·Granted Oct 27, 2020·1 cites·22 claims

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