Inventor · disambiguated record
Mike Van Riet
Also filed as: VAN RIET MIKE
3 granted patents·126 citations·filing 2005–2007
75Inventor score
Files withKLA TENCOR TECH CORP3
Top patents by PatentIndex Score
3 records- 0192US7570797B1Methods and systems for generating an inspection process for an inspection systemKLA TENCOR TECH CORP·Filed 2005·Granted Aug 4, 2009·83 cites·20 claims
- 0289US7747062B2Methods, defect review tools, and systems for locating a defect in a defect review processKLA TENCOR TECH CORP·Filed 2005·Granted Jun 29, 2010·32 cites·30 claims
- 0378US7925072B2Methods for identifying array areas in dies formed on a wafer and methods for setting up such methodsKLA TENCOR TECH CORP·Filed 2007·Granted Apr 12, 2011·11 cites·9 claims
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