Inventor · disambiguated record

Eric Maiken

Also filed as: MAIKEN ERIC

1 granted patent·24 citations·filing 2001–2001

42Inventor score

Technology areasG01N

Files withN & K TECHNOLOGY INC1

Top patents by PatentIndex Score

1 record

0181US6594025B2Method of monitoring thin-film processes and metrology tool thereofN & K TECHNOLOGY INC·Filed 2001·Granted Jul 15, 2003·24 cites·22 claims

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Eric Maiken — Patent Inventor | PatentIndex