Inventor · disambiguated record
Munetoshi Fukui
Also filed as: FUKUI MUNETOSHI
3 granted patents·8 citations·filing 2008–2021
60Inventor score
Top patents by PatentIndex Score
3 records- 0182US7663104B2Specimen inspection equipment and how to make electron beam absorbed current imagesHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·6 cites·8 claims
- 0269US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 0347US12477763B2Semiconductor deviceUNIV TOKYO·Filed 2021·Granted Nov 18, 2025·0 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →