Inventor · disambiguated record
Frank E. Gennari
Also filed as: GENNARI FRANK · GENNARI FRANK E
28 granted patents·639 citations·filing 2002–2019
98Inventor score
Top patents by PatentIndex Score
28 records- 0197US7653892B1System and method for implementing image-based design rulesCADENCE DESIGN SYSTEMS INC·Filed 2005·Granted Jan 26, 2010·48 cites·16 claims
- 0297US7418693B1System and method for analysis and transformation of layouts using situationsCADENCE DESIGN SYSTEMS INC·Filed 2005·Granted Aug 26, 2008·72 cites·10 claims
- 0396US7818707B1Fast pattern matchingCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Oct 19, 2010·36 cites·25 claims
- 0494US7707542B1Creating a situation repositoryCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Apr 27, 2010·24 cites·27 claims
- 0594US7155698B1Method of locating areas in an image such as a photo mask layout that are sensitive to residual processing effectsUNIV CALIFORNIA·Filed 2003·Granted Dec 26, 2006·58 cites·26 claims
- 0693US9519732B1Methods, systems, and articles of manufacture for implementing pattern-based design enabled manufacturing of electronic circuit designsCADENCE DESIGN SYSTEMS INC·Filed 2013·Granted Dec 13, 2016·18 cites·23 claims
- 0793US7831942B1Design check databaseCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Nov 9, 2010·20 cites·48 claims
- 0892US8832621B1Topology design using squish patternsGENNARI FRANK E·Filed 2011·Granted Sep 9, 2014·18 cites·19 claims
- 0992US8807948B2System and method for automated real-time design checkingLUO WILBUR·Filed 2011·Granted Aug 19, 2014·81 cites·39 claims
- 1092US8429582B1Methods, systems, and articles of manufacture for smart pattern capturing and layout fixingLAI YA-CHIEH·Filed 2010·Granted Apr 23, 2013·20 cites·23 claims
- 1191US9053259B1Methods, systems, and articles of manufacture for implementing pattern-based design enabled manufacturing of electronic circuit designsCADENCE DESIGN SYSTEMS INC·Filed 2013·Granted Jun 9, 2015·16 cites·21 claims
- 1291US8079005B2Method and system for performing pattern classification of patterns in integrated circuit designsLAI YA-CHIEH·Filed 2008·Granted Dec 13, 2011·29 cites·29 claims
- 1391US7030997B2Characterizing aberrations in an imaging lens and applications to visual testing and integrated circuit mask analysisUNIV CALIFORNIA·Filed 2002·Granted Apr 18, 2006·85 cites·25 claims
- 1490US8769474B1Fast pattern matchingGENNARI FRANK E·Filed 2010·Granted Jul 1, 2014·8 cites·20 claims
- 1590US8327299B1System and method for implementing image-based design rulesGENNARI FRANK E·Filed 2009·Granted Dec 4, 2012·13 cites·20 claims
- 1689US8516406B1Methods, systems, and articles of manufacture for smart pattern capturing and layout fixingLAI YA-CHIEH·Filed 2010·Granted Aug 20, 2013·12 cites·27 claims
- 1788US8365103B1System and method for implementing image-based design rulesCADENCE DESIGN SYSTEMS INC·Filed 2009·Granted Jan 29, 2013·10 cites·33 claims
- 1888US7752577B1Constraint plus patternCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Jul 6, 2010·11 cites·51 claims
- 1986US8677301B2Method and system for model-based design and layout of an integrated circuitLAI YA-CHIEH·Filed 2012·Granted Mar 18, 2014·8 cites·20 claims
- 2086US8631373B1Yield analysis with situationsGENNARI FRANK E·Filed 2009·Granted Jan 14, 2014·8 cites·19 claims
- 2184US8543965B1Methods, systems, and articles of manufacture for smart pattern capturing and layout fixingLAI YA-CHIEH·Filed 2010·Granted Sep 24, 2013·7 cites·24 claims
- 2283US8645887B2Method and system for model-based design and layout of an integrated circuitLAI YA-CHIEH·Filed 2012·Granted Feb 4, 2014·6 cites·20 claims
- 2383US8381152B2Method and system for model-based design and layout of an integrated circuitCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Feb 19, 2013·10 cites·33 claims
- 2482US8086981B2Method and system for design rule checking enhanced with pattern matchingLAI YA-CHIEH·Filed 2008·Granted Dec 27, 2011·12 cites·26 claims
- 2580US10796067B1EDA CAA with learning phaseCADENCE DESIGN SYSTEMS INC·Filed 2019·Granted Oct 6, 2020·2 cites·19 claims
- 2678US7661087B1Yield analysis with situationsCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Feb 9, 2010·4 cites·24 claims
- 2776US8091047B1System and method for implementing image-based design rulesGENNARI FRANK E·Filed 2009·Granted Jan 3, 2012·3 cites·20 claims
- 2845US11928582B1System, media, and method for deep learningCADENCE DESIGN SYSTEMS INC·Filed 2018·Granted Mar 12, 2024·0 cites·20 claims
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