Inventor · disambiguated record
Christoph Kappel
Also filed as: KAPPEL CHRISTOPH
3 granted patents·1 pending application·1 citations·filing 2010–2024
46Inventor score
Files withESTERMANN MARKUS1INSTR SYSTEMS GMBH1INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH1MARKWORT LARS1
Top patents by PatentIndex Score
4 records- 0149US2024344975A1Colorimetry method and systemINSTR SYSTEMS GMBH·Filed 2024·Application pending·0 cites
- 0248US9355919B2Methods and systems for inspecting bonded wafersESTERMANN MARKUS·Filed 2011·Granted May 31, 2016·1 cites·18 claims
- 0336US10295407B2Light source having a controllable spectrumINSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBH·Filed 2016·Granted May 21, 2019·0 cites·10 claims
- 0432US8778702B2Method of inspecting and processing semiconductor wafersMARKWORT LARS·Filed 2010·Granted Jul 15, 2014·0 cites·41 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →