Inventor · disambiguated record
Emmanuel Lakios
Also filed as: LAKIOS EMMANUEL · LAKIOS EMMANUEL N
11 granted patents·5 pending applications·329 citations·filing 1988–2022
91Inventor score
Top patents by PatentIndex Score
16 records- 0190US4949783ASubstrate transport and cooling apparatus and method for sameVEECO INSTR INC·Filed 1988·Granted Aug 21, 1990·147 cites·6 claims
- 0289US10687598B2Ultraviolet razor blade treatmentSENSOR ELECTRONIC TECH INC·Filed 2017·Granted Jun 23, 2020·5 cites·20 claims
- 0388US5969470ACharged particle sourceVEECO INSTR INC·Filed 1996·Granted Oct 19, 1999·59 cites·31 claims
- 0487US10517974B2Ultraviolet surface illumination systemSENSOR ELECTRONIC TECH INC·Filed 2017·Granted Dec 31, 2019·5 cites·20 claims
- 0585US6716322B1Method and apparatus for controlling film profiles on topographic featuresVEECO INSTR INC·Filed 2002·Granted Apr 6, 2004·33 cites·51 claims
- 0684US6150755ACharged particle source with liquid electrodeVEECO INSTR INC·Filed 1999·Granted Nov 21, 2000·42 cites·11 claims
- 0774US7879201B2Method and apparatus for surface processing of a substrateVEECO INSTR INC·Filed 2004·Granted Feb 1, 2011·14 cites·15 claims
- 0863US10149983B2Skin tanning and phototherapy system and apparatusSEOUL VIOSYS CO LTD·Filed 2016·Granted Dec 11, 2018·2 cites·22 claims
- 0957US6225747B1Charged-particle source, control system and process using gating to extract the charged particle beamVEECO INSTR INC·Filed 1999·Granted May 1, 2001·12 cites·20 claims
- 1056US2011089022A1Method and apparatus for surface processing of a substrateVEECO INSTR INC·Filed 2010·Application pending·0 cites
- 1153US5982101ACharged-particle source, control system, and process using gating to extract the ion beamVEECO INSTR INC·Filed 1997·Granted Nov 9, 1999·10 cites·29 claims
- 1252US2024263352A1Controlled nanomaterial manufacturingCVD EQUIPMENT CORP·Filed 2022·Application pending·0 cites
- 1344US2017095582A1Integrated Flip Chip Device ArraySENSOR ELECTRONIC TECH INC·Filed 2016·Application pending·0 cites
- 1442US10090210B2Material growth with temperature controlled layerSENSOR ELECTRONIC TECH INC·Filed 2016·Granted Oct 2, 2018·0 cites·18 claims
- 1539US2013206583A1Method and Apparatus for Surface Processing of a Substrate Using an Energetic Particle BeamVEECO INSTR INC·Filed 2013·Application pending·0 cites
- 1632US2017360011A1Lighting system for reptile and reptile habitat including the sameSEOUL VIOSYS CO LTD·Filed 2016·Application pending·0 cites
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