Inventor · disambiguated record
David Scheiner
Also filed as: SCHEINER DAVID
31 granted patents·7 pending applications·798 citations·filing 1983–2025
97Inventor score
Top patents by PatentIndex Score
38 records- 0198US6974962B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2001·Granted Dec 13, 2005·120 cites·17 claims
- 0296US6476920B1Method and apparatus for measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 2000·Granted Nov 5, 2002·153 cites·37 claims
- 0395US9140539B2Optical system and method for measurement of one or more parameters of via-holesNOVA MEASURING INSTR LTD·Filed 2013·Granted Sep 22, 2015·19 cites·20 claims
- 0492US6556947B1Optical measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 2000·Granted Apr 29, 2003·79 cites·24 claims
- 0592US6281974B1Method and apparatus for measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 2000·Granted Aug 28, 2001·55 cites·40 claims
- 0691US8531679B2Optical system and method for measurement of one or more parameters of via-holesSCHEINER DAVID·Filed 2008·Granted Sep 10, 2013·23 cites·28 claims
- 0791US6100985AMethod and apparatus for measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 1999·Granted Aug 8, 2000·107 cites·35 claims
- 0888US7292341B2Optical system operating with variable angle of incidenceNOVA MEASURING INSTR LTD·Filed 2003·Granted Nov 6, 2007·33 cites·3 claims
- 0988US7187456B2Method and apparatus for measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 2005·Granted Mar 6, 2007·11 cites·30 claims
- 1082US11849207B2Inspection system for use in monitoring plants in plant growth areasVIEWNETIC LTD·Filed 2022·Granted Dec 19, 2023·1 cites·23 claims
- 1182US6815947B2Method and system for thickness measurements of thin conductive layersNOVA MEASURING INSTR LTD·Filed 2003·Granted Nov 9, 2004·42 cites·41 claims
- 1280US6940609B2Method and system for measuring the topography of a sampleNOVA MEASURING INSTR LTD·Filed 2002·Granted Sep 6, 2005·25 cites·28 claims
- 1378US6292265B1Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objectsNOVA MEASURING INSTR LTD·Filed 1999·Granted Sep 18, 2001·56 cites·13 claims
- 1477US9785059B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2016·Granted Oct 10, 2017·1 cites·15 claims
- 1577US2025296143A1Additive metal casting methodMAGNUS METAL LTD·Filed 2025·Application pending·0 cites
- 1675US12053817B2Sand molding for metal additive castingMAGNUS METAL LTD·Filed 2023·Granted Aug 6, 2024·0 cites·24 claims
- 1775US6801315B2Method and system for overlay measurementNOVA MEASURING INSTR LTD·Filed 2002·Granted Oct 5, 2004·13 cites·43 claims
- 1874US12445709B2Inspection system for use in monitoring plants in plant growth areasVIEWNETIC LTD·Filed 2023·Granted Oct 14, 2025·0 cites·18 claims
- 1973US11766715B2Sand molding for metal additive castingMAGNUS METAL LTD·Filed 2022·Granted Sep 26, 2023·0 cites·24 claims
- 2073US11483471B2Inspection system for use in monitoring plants in plant growth areasVIEWNETIC LTD·Filed 2019·Granted Oct 25, 2022·1 cites·31 claims
- 2169US12343791B2Additive metal casting system and apparatusMAGNUS METAL LTD·Filed 2022·Granted Jul 1, 2025·0 cites·18 claims
- 2269US6801326B2Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objectsNOVA MEASURING INSTR LTD·Filed 2001·Granted Oct 5, 2004·13 cites·29 claims
- 2367US7532414B2Reflective optical systemNOVA MEASURING INSTR LTD·Filed 2007·Granted May 12, 2009·4 cites·20 claims
- 2465US6885446B2Method and system for monitoring a process of material removal from the surface of a patterned structureNOVA MEASURING INSTR LTD·Filed 2002·Granted Apr 26, 2005·6 cites·43 claims
- 2565US6836324B2Method and apparatus for measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 2001·Granted Dec 28, 2004·8 cites·36 claims
- 2664US7123366B2Method and apparatus for measurements of patterned structuresNOVA MEASURING INSTR LTD·Filed 2004·Granted Oct 17, 2006·7 cites·47 claims
- 2763US2018031983A1Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2017·Application pending·0 cites
- 2861US7253970B2Reflective optical systemNOVA MEASURING INSTR LTD·Filed 2004·Granted Aug 7, 2007·8 cites·50 claims
- 2952US11601587B2System and method for monitoring plants in plant growing areasVIEWNETIC LTD·Filed 2019·Granted Mar 7, 2023·0 cites·24 claims
- 3048US12484466B2Systems and methods for monitoring plants in plant growing areasVIEWNETIC LTD·Filed 2020·Granted Dec 2, 2025·0 cites·36 claims
- 3148US10316419B2System for utilizing excess heat for carrying out electrochemical reactionsNEWCO2FUELS LTD·Filed 2014·Granted Jun 11, 2019·0 cites·12 claims
- 3247US2015047985A1Apparatus and method for using solar radiation in electrolysis processYEDA RES & DEV·Filed 2013·Application pending·0 cites
- 3345US2009213377A1Reflective optical systemNOVA MEASURING INSTR LTD·Filed 2009·Application pending·0 cites
- 3445US2005140953A1Image enhancement of substantially coherent imaging systemsFiled 2003·Application pending·0 cites
- 3544US10072344B2Device and apparatus for carrying out chemical dissociation reactions at elevated temperaturesYEDA RES & DEV·Filed 2013·Granted Sep 11, 2018·0 cites·21 claims
- 3642US4500552AGelatin dessert productKADISON LAB INC·Filed 1983·Granted Feb 19, 1985·13 cites·7 claims
- 3741US2011089348A1Method and apparatus for thin film quality controlFINAROV MOSHE·Filed 2010·Application pending·0 cites
- 3834US2001015811A1Test structure for metal CMP process controlNOVA MEASURING INSTR LTD·Filed 2001·Application pending·0 cites
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