Inventor · disambiguated record
Harsanjeet Singh
Also filed as: SINGH HARSANJEET
4 granted patents·3 pending applications·76 citations·filing 2004–2013
75Inventor score
Top patents by PatentIndex Score
7 records- 0191US7209851B2Method and structure to develop a test program for semiconductor integrated circuitsADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Apr 24, 2007·60 cites·30 claims
- 0287US8255198B2Method and structure to develop a test program for semiconductor integrated circuitsKRISHNASWAMY RAMACHANDRAN·Filed 2010·Granted Aug 28, 2012·11 cites·12 claims
- 0375US9785542B2Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testingADVANTEST CORP·Filed 2013·Granted Oct 10, 2017·5 cites·21 claims
- 0445US9274911B2Using shared pins in a concurrent test execution environmentADVANTEST CORP·Filed 2013·Granted Mar 1, 2016·0 cites·23 claims
- 0541US2008016396A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0641US2008010524A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 0733US2005039079A1Test emulator, test module emulator, and record medium storing program thereinFiled 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →