Inventor · disambiguated record

Chin-Pin Jen

Also filed as: JEN CHIN-PIN

1 granted patent·6 citations·filing 2003–2003

27Inventor score

Technology areasG01R

Files withUNITED MICROELECTRONICS CORP1

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1 record

0145US7076707B2Methodology of locating faults of scan chains in logic integrated circuitsUNITED MICROELECTRONICS CORP·Filed 2003·Granted Jul 11, 2006·6 cites·7 claims

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