Inventor · disambiguated record
Juinn Lee
Also filed as: LEE JUINN
1 granted patent·1 pending application·6 citations·filing 2003–2020
27Inventor score
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2 records- 0145US7076707B2Methodology of locating faults of scan chains in logic integrated circuitsUNITED MICROELECTRONICS CORP·Filed 2003·Granted Jul 11, 2006·6 cites·7 claims
- 0230US2021027890A1Detecting, evaluating and predicting system for cancer riskCONNSANTE BIOTECH INC·Filed 2020·Application pending·0 cites
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