Inventor · disambiguated record
Gyoo-Chan Sim
Also filed as: SIM GYOO-CHAN
7 granted patents·126 citations·filing 1998–2002
86Inventor score
Files withSAMSUNG ELECTRONICS CO LTD7
Top patents by PatentIndex Score
7 records- 0178US6374380B1Boundary scan cells to improve testability of core-embedded circuitsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Apr 16, 2002·45 cites·21 claims
- 0269US6546511B1Apparatus and method for parallel testing of multiple functional blocks of an integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Apr 8, 2003·21 cites·19 claims
- 0364US6199184B1Parallel signature compression circuit and method for designing the sameSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 6, 2001·26 cites·8 claims
- 0452US6691289B2Semiconductor integrated circuit including circuit for selecting embedded tap coresSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Feb 10, 2004·7 cites·6 claims
- 0549US6573742B2Semiconductor integrated circuit with test points inserted thereintoSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jun 3, 2003·5 cites·17 claims
- 0648US6125460AMethod for testing semiconductor device having embedded nonvolatile memorySAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Sep 26, 2000·14 cites·16 claims
- 0738US6240537B1Signature compression circuit and methodSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted May 29, 2001·8 cites·17 claims
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