Inventor · disambiguated record
Shang-Jung Hsieh
Also filed as: HSIEH SHANG-JUNG
6 granted patents·4 pending applications·10 citations·filing 2012–2024
71Inventor score
Top patents by PatentIndex Score
10 records- 0190US10119991B2Vertical probe device and supporter used in the sameMPI CORP·Filed 2015·Granted Nov 6, 2018·8 cites·3 claims
- 0276US11150269B2Probe head for high frequency signal test and medium or low frequency signal test at the same timeMPI CORP·Filed 2020·Granted Oct 19, 2021·1 cites·18 claims
- 0357US2025314677A1Probe seat having supporting structure, probe head, probe card and probe systemMPI CORP·Filed 2024·Application pending·0 cites
- 0456US8662711B2Optical reflection plate and lighting device having the sameCHEN SHENG-PING·Filed 2012·Granted Mar 4, 2014·1 cites·8 claims
- 0556US2025020692A1Adhered multilayer die unit and probe head, probe seat, probe card and test system including the sameMPI CORP·Filed 2024·Application pending·0 cites
- 0655US2024241155A1Probe cards, dut side modules of the probe cards, testing methods and systems that include the probe cards, tested devices and methods of producing tested devices by utilizing the probe cardsMPI CORP·Filed 2024·Application pending·0 cites
- 0748US9638716B2Positioner of probe card and probe head of probe cardMPI CORP·Filed 2014·Granted May 2, 2017·0 cites·15 claims
- 0847US11346860B2Probe head for high frequency signal test and medium or low frequency signal test at the same timeMPI CORP·Filed 2020·Granted May 31, 2022·0 cites·17 claims
- 0944US2013258652A1Light-guiding element, illumination module and laminate lamp apparatusLEXTAR ELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 1040US8770786B2Illuminating device with light guiding frameLEXTAR ELECTRONICS CORP·Filed 2013·Granted Jul 8, 2014·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →