Inventor · disambiguated record
Kevin P. Cowles
Also filed as: COWLES KEVIN · COWLES KEVIN P · COWLES KEVIN PARK
13 granted patents·1 pending application·174 citations·filing 2000–2025
90Inventor score
Top patents by PatentIndex Score
14 records- 0196US6700748B1Methods for creating ground paths for ILSIBM·Filed 2000·Granted Mar 2, 2004·98 cites·6 claims
- 0291US10034424B2Crop attribute sensing with crop loss inhibitorsDEERE & CO·Filed 2016·Granted Jul 31, 2018·16 cites·22 claims
- 0385US7396254B2Flexible electrical connector/housing assemblyDEERE & CO·Filed 2006·Granted Jul 8, 2008·26 cites·9 claims
- 0482US10952366B2Seed positioning device, seed dispensing system, and method of dispensing seedDEERE & CO·Filed 2018·Granted Mar 23, 2021·7 cites·14 claims
- 0576US7320174B2Methods for creating ground paths for ILSHITACHI GLOBAL STORAGE TECH·Filed 2003·Granted Jan 22, 2008·17 cites·21 claims
- 0673US2025348955A1Agricultural planting machine with field contour sensorsDEERE & CO·Filed 2025·Application pending·0 cites
- 0772US11470766B2Device and method for detecting objects passing through a passagewayDEERE & CO·Filed 2020·Granted Oct 18, 2022·1 cites·33 claims
- 0871US10820503B2Monitoring device for monitoring crop yieldDEERE & CO·Filed 2018·Granted Nov 3, 2020·2 cites·20 claims
- 0968US12361500B2Agricultural planting machine with field contour sensorsDEERE & CO·Filed 2022·Granted Jul 15, 2025·0 cites·21 claims
- 1068US12096717B2Monitoring device for monitoring crop yieldDEERE & CO·Filed 2020·Granted Sep 24, 2024·0 cites·27 claims
- 1160US10716256B2Sensor system for determining crop yieldDEERE & CO·Filed 2018·Granted Jul 21, 2020·1 cites·20 claims
- 1250USD811447SOperator station displayDEERE & CO·Filed 2017·Granted Feb 27, 2018·6 cites·1 claims
- 1347US11029275B2Device for detecting a wear level of a wear plateDEERE & CO·Filed 2018·Granted Jun 8, 2021·0 cites·20 claims
- 1446US11493426B2Device and method for adjusting a signal for an object detectorDEERE & CO·Filed 2020·Granted Nov 8, 2022·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →