Inventor · disambiguated record

Barbara L Shiffler

Also filed as: SHIFFLER BARBARA L

1 granted patent·17 citations·filing 2007–2007

38Inventor score

Technology areasH10P

Files withIBM1

Top patents by PatentIndex Score

1 record

0183US7864502B2In situ monitoring of wafer charge distribution in plasma processingIBM·Filed 2007·Granted Jan 4, 2011·17 cites·27 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →