Inventor · disambiguated record
Min-Hsin Hsieh
Also filed as: HSIEH MIN-HSIN
2 granted patents·5 citations·filing 2012–2015
51Inventor score
Top patents by PatentIndex Score
2 records- 0183US9703919B2System and method of filtering actual defects from defect information for a waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jul 11, 2017·3 cites·20 claims
- 0264US9057965B2Method of generating a set of defect candidates for waferTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Jun 16, 2015·2 cites·22 claims
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