Inventor · disambiguated record

Sung-Gon Ryu

Also filed as: RYU SUNG-GON

1 granted patent·1 pending application·4 citations·filing 2001–2006

24Inventor score

Technology areasH10P

Files withRYU SUNG-GON1 SAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

2 records

0151US7027638B2Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Apr 11, 2006·4 cites·18 claims
0234US2007025609A1Method of detecting defect of a pattern in a semiconductor deviceRYU SUNG-GON·Filed 2006·Application pending·0 cites

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