Inventor · disambiguated record
Yohei Minekawa
Also filed as: MINEKAWA YOHEI
18 granted patents·2 pending applications·34 citations·filing 2010–2022
89Inventor score
Top patents by PatentIndex Score
20 records- 0190US9401015B2Defect classification method, and defect classification systemMINEKAWA YOHEI·Filed 2012·Granted Jul 26, 2016·12 cites·14 claims
- 0287US12260545B2Sample observation device and methodHITACHI HIGH TECH CORP·Filed 2022·Granted Mar 25, 2025·1 cites·16 claims
- 0384US10436576B2Defect reviewing method and deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 8, 2019·5 cites·4 claims
- 0481US8824773B2Defect observation method and defect observation deviceMINEKAWA YOHEI·Filed 2010·Granted Sep 2, 2014·6 cites·20 claims
- 0579US10593062B2Defect observation apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 17, 2020·2 cites·12 claims
- 0673US10971325B2Defect observation system and defect observation method for semiconductor waferHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 6, 2021·1 cites·16 claims
- 0771US9342879B2Method and apparatus for reviewing defectMINEKAWA YOHEI·Filed 2012·Granted May 17, 2016·3 cites·17 claims
- 0867US8892494B2Device for classifying defects and method for adjusting classificationONO MAKOTO·Filed 2010·Granted Nov 18, 2014·3 cites·9 claims
- 0964US10297021B2Defect quantification method, defect quantification device, and defect evaluation value display deviceHITACHI HIGH TECH CORP·Filed 2015·Granted May 21, 2019·1 cites·17 claims
- 1063US2024327775A1Training method and device for machine learning modelHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1151US12333695B2Sample observation system and image processing methodHITACHI HIGH TECH CORP·Filed 2021·Granted Jun 17, 2025·0 cites·19 claims
- 1251US11177111B2Defect observation deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 16, 2021·0 cites·15 claims
- 1350US11501950B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Nov 15, 2022·0 cites·8 claims
- 1449US12511729B2Defect classification device and defect classification programHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 30, 2025·0 cites·6 claims
- 1548US12154264B2Defect inspecting system and defect inspecting methodHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 26, 2024·0 cites·9 claims
- 1647US2024127417A1Inspection System and Non-Transitory Computer-Readable MediumHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
- 1745US11670528B2Wafer observation apparatus and wafer observation methodHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 6, 2023·0 cites·10 claims
- 1845US10770260B2Defect observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 8, 2020·0 cites·14 claims
- 1944US10203851B2Defect classification apparatus and defect classification methodHITACHI HIGH TECH CORP·Filed 2012·Granted Feb 12, 2019·0 cites·21 claims
- 2035US10074511B2Defect image classification apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 11, 2018·0 cites·9 claims
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